Sep 7 2010
BT Imaging Pty Ltd (BTi), the world's leading supplier of luminescence-based inspection and quality control systems for the photovoltaic manufacturing industry, today announced the iLS-X1 inspection system that is specifically designed for cost-effective inline monitoring of solar photovoltaic electrical process quality.
Based on BT Imaging's next-generation non-stop photoluminescence (PL) imaging technology, the iLS-X1 inspects processed wafers and cells at full line speed -- 3,600 wafers per hour -- enabling cell manufacturers to quickly understand and fix the electrical wafer issues that are impacted by a given process step. The iLS-X1 is designed for easy integration over-the-process-belt or with OEM systems, and includes automated defect classification software.
iLS-X1, inline solar photovoltaic cell process quality monitor
"Electrical process quality is an important metric for our customers, especially as the industry moves towards higher efficiency cells," stated Ian Maxwell, chief executive officer of BT Imaging. "We believe that the iLS-X1 will help solar photovoltaic manufacturers focus on the process issues that matter to them and increase final cell performance."
Existing inline solar PV inspection tools primarily monitor only the physical attributes of solar wafers and cells like thickness, cracks, color, and pattern using optical techniques. Electrical defects such as dislocations and impurities in the wafer, and defects introduced by incorrect cell processing -- which significantly impact cell electrical performance -- are not seen by current inspection techniques. As the industry migrates to higher efficiency cells, which use patterned emitters and back side contacts, high resolution electrical data is essential to determine if the wafer and cell manufacturing process is operating optimally to maximize final cell efficiency. Photoluminescence imaging inspection is the only technology capable of seeing the full electrical impact of the process on solar wafers and cells.
Easy Integration Into the Process Line
The iLS-X1 is compact and can be easily integrated above any process belt or with OEM systems. BT Imaging will collaborate with OEMs to meet customer needs. The iLS-X1 ™ can be mounted above the production conveyer belt at process steps from post diffusion and onwards, to finished cells. It takes high-resolution (1 MP) PL images of wafers and cells as they go by. Because there is no need to stop the belt to take the image, the iLS-X1 achieves throughput of up to 3,600 wafers per hour, enabling inspection of processed wafers and cells at full line speed.
From Data to Process Improvements
The iLS-X1 offers automatic defect classification. Automated algorithms extract defect signatures from the high-resolution PL images and report the different process defect types seen in cell processes. User definable classification settings allow users to adjust parameters based on their particular requirements. By inspecting and detecting defects generated by a given process, the defects can be correlated with final cell performance. With the iLS-X1, processes can be improved for optimum electrical process performance and monitored to ensure they stay within specification.
The iLS-X1 will start shipping to beta customers in the fourth quarter of 2010. BT Imaging is accepting orders now. The iLS-X1 will be on display at BT Imaging's booth -- Level 2, Hall 3, Stand 8 -- at the 25th EU PVSEC 2010 in Valencia, Spain from September 6 through September 9, 2010.
Source: http://www.btimaging.com/