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Etron Chooses Analog FastSPICE Nanometer Circuit Verification Platform

Taiwan-based Etron Technologies, which is a fabless Integrated Circuits design and product company has selected Berkeley Design Automation’s Analog FastSPICE(AFS) Platform for verifying the integrity of their memory designs used in consumer and low-power products.

AFS Platform

The AFS Platform is an open source analog electronic nanometer circuit simulator platform that is one of the fastest in verifying RF, analog and mixed signal circuits. It is capable of delivering up to 5x-10x faster SPICE accurate simulation on a single core and 2x-4x increased performance upon multithreading. The AFS Platform also includes performance estimation and characterization capabilities wherein performance scales near linearly with increasing number of cores and silicon-accurate device noise analysis can be carried out respectively. It has the capacity to deliver greater than 10M elements with no degeneration of accuracy and can also be used for mixed mode simulation analysis along with Verilog simulators. The AFS Platform offers licenses for a suite of products such as AFS RF Analysis, AFS circuit simulation, AFS Nano SPICE, AFS Transient Noise Analysis and AFS Co-Simulation.

Bor-Doou Rong, Vice President at Etron, stated that the capabilities of the AFS Platform will help Etron meet their quality and yield requirements for their packaged memory ICs and unpackaged Known-Good-Die. Ravi Subramanian, president and CEO of Berkeley Design, expressed excitement on the recent development and said that Etron’s selection is testimony to increased preference for Berkley Design as a verification partner to leading IC designers.

Will Soutter

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Will Soutter

Will has a B.Sc. in Chemistry from the University of Durham, and a M.Sc. in Green Chemistry from the University of York. Naturally, Will is our resident Chemistry expert but, a love of science and the internet makes Will the all-rounder of the team. In his spare time Will likes to play the drums, cook and brew cider.

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