Researchers Employ X-Ray and Microscope Combination for Magnetic and Elemental Imaging

By Will SoutterJun 15 2012

The Review of Scientific Instruments journal from the American Institute of Physics has published the results of an experimental study by a team of researchers that has developed an imaging device which combines a synchrotron X-ray source and an optical microscope.

The device can image the elemental and magnetic characteristics of an extensive range of materials that find application in energy-based devices such as solid-state lighting and solar cells.

The technique employed is called X-ray excited luminescence microscopy (XELM). The set-up consists of a microscope attached to a synchrotron. Synchrotrons project electrons at near-light speed on a curved trajectory in order to produce electromagnetic radiations such as X-rays. The material to be studied absorbs some of the X-rays when they strike it, thereby leading to luminescence. The attached microscope is used to identify variations in luminescence which is an indication of the magnetic and elemental properties of the material. The spatial resolution of the microscope enables the device to resolve attributes measuring as low as 1 µ.

Major advantages of the XELM technique are the capability to image under the influence of magnetic and electric fields and operability at low temperature. The only limitation is by way of stability as the system used for directing the X-rays vibrates. The team expects future improvisations to address this limitation.