Olympus Introduces New Laser Microscope for 3D Surface Measurement

The LEXT OLS4100 3D measuring laser microscope uses laser scanning to perform non-contact 3D measurement of complex surface features on electronic devices and other samples. As with current Olympus models, the LEXT OLS4100 guarantees both repeatability*1 and accuracy*2, while also being capable of high-resolution observation and highly accurate measurement over a wider area.

It also features easier operation, including a function for acquiring 3D images automatically with a single click, and an image acquisition speed that is approximately twice as fast as the existing Olympus models.

1. *1 The degree of variation among repeated measurement values. A technical term used in metrology.
2. *2 How close a measurement value is to its true value. A technical term used in metrology.

Main Features

• High-resolution observation and highly accurate measurement over a wider area beyond a single scan up to 625 images.
• Designed to be easy to operate even for novice users, including functions for automatic 3D image acquisition.
• 3D image acquisition approximately twice as fast as the existing Olympus models.

Launch Background

• With products such as portable digital devices and industrial equipment becoming smaller and achieving higher performance over recent years, there has also been a demand for miniaturization and performance enhancements in the sensors and other electronic components used in these products. As these components also require rigorous quality control, there is a need for highly reliable 3D surface measurement instruments capable of measuring surface features and textures such as steps and roughness.
• Meanwhile, the range of industries that require quantitative control of minute surface features is expanding rapidly to include the automotive and high-functional materials sectors, for example. Accordingly, the nature of samples is also becoming more diverse, including samples with complex shapes or adhesive properties, and in particular there is a growing demand for instruments that can be used not only in research and development but also in applications that are closer to the production process.
• The ability of the Olympus LEXT series of 3D measuring laser microscopes to observe and measure 3D surface features with sizes ranging from several hundreds of microns down to the sub-micron level has seen them enter widespread use in both industry and academic research. Now, Olympus has added the new model to meet the demand for making measurements and observations with greater accuracy over a wider area.

Main Features

• High-resolution observation and highly accurate measurement over a wider area beyond a single scan up to 625 images
  • While performing measurements over a wide area typically involves using a low magnification, there is a limit to how clear such images can be rendered. To overcome this problem, the new microscopes can perform high-resolution observation and highly accurate measurement over a wide area using a stitching function that combines up to 625 different high-magnification images together so that minute regions can be identified with high resolution. Whereas most laser microscopes in the past have been used in R&D and related fields for making observations of very small samples, the ability to view large areas with high accuracy also opens up potential applications for the microscopes as quality control tools in industry.
• Designed to be easy to operate even for novice users, including functions for automatic 3D image acquisition
  • Traditionally, 3D imaging has required complex settings (brightness and upper and lower limits). With the new Smart Scan mode, in contrast, users can acquire 3D images with a single click. This function has been designed to allow even first-time users to obtain results equivalent to those of an experienced operator.
• 3D image acquisition approximately twice as fast as the existing Olympus models
  • The new Ultra-Fast mode acquires 3D images approximately twice as fast as the existing Fast mode, and nine times faster than Fine mode. This boosts inspection efficiency by speeding up shape observation and measurement.