Posted in | News | Microscopy | Nanoanalysis

Piezosystem Jena Announce PZ300 Z-Axis Stage for Advanced Microscopy

The accuracy and speed of probe positioning is a critical and important value for microscopy techniques such as laser scanning microscopy, or other techniques including fluorescent, super resolution, or image processing. In order to provide the user with a tool able to improve these techniques, piezosystem jena provides the new PZ 300 piezoelectric actuator based z-axis elevator stage for microscopes.

The PZ 300 AP piezo stage is made for adapting onto the top of standard XY microscopy stages. Due to its flat design, the stage can be used for standard microscopes as well as for inverted stands. The monolithic stage design is completely free of any mechanical play and offers a travel range of up to 300 microns with a step resolution of ±2.5 nanometers.

The unique stage design offers extraordinary dynamic parameters and a settling time under a load of a few milliseconds. The quick and precise positioning of probes allows the user to make measurements and carry out line scans with greater speed and to reach a much better signal quality for their results.

The sophisticated piezo stage design of the PZ 300 AP series has two parallel working piezo drives which allow the centrically located microscopy probe adapter to be lifted symmetrically.
The PZ 300 AP stage contains a large free aperture thus enabling the piezo stage to work with standard slides and Multiwell® plates as well as Petri-Dishes.

We recommend fixing the PZ 300 AP stage on top of the microscopy stage if the z-elevator stage is to be used for a dynamic application. The high dynamic capacity of the piezo driven stage can only be an advantage for scanning when the PZ 300 AP is mounted safely. A list of microscopy stage adapters available can be downloaded from the piezosystem jena website.

The PZ 300 AP series can be equipped with integrated feedback sensors for closed loop positioning control. A certain position can be stored and this point can be approached repeatedly with accuracy in the nanometer range.

More information about the piezosystem jena program for microscopy applications is available on their website.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Piezosystem Jena GmbH. (2019, February 11). Piezosystem Jena Announce PZ300 Z-Axis Stage for Advanced Microscopy. AZoNano. Retrieved on November 21, 2024 from https://www.azonano.com/news.aspx?newsID=28276.

  • MLA

    Piezosystem Jena GmbH. "Piezosystem Jena Announce PZ300 Z-Axis Stage for Advanced Microscopy". AZoNano. 21 November 2024. <https://www.azonano.com/news.aspx?newsID=28276>.

  • Chicago

    Piezosystem Jena GmbH. "Piezosystem Jena Announce PZ300 Z-Axis Stage for Advanced Microscopy". AZoNano. https://www.azonano.com/news.aspx?newsID=28276. (accessed November 21, 2024).

  • Harvard

    Piezosystem Jena GmbH. 2019. Piezosystem Jena Announce PZ300 Z-Axis Stage for Advanced Microscopy. AZoNano, viewed 21 November 2024, https://www.azonano.com/news.aspx?newsID=28276.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.