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Results 1151 - 1160 of 1263 for Scanning electron microscopes
  • Article - 15 Sep 2023
    In the world of semiconductor nanodevices, where quantum effects and atomic positions dictate behavior, spectroscopic techniques emerge as powerful tools to unlock their quantum properties and explore...
  • Article - 16 Aug 2023
    Two-photon microscopy is a type of fluorescence microscopy that, rather than exciting the sample with a single photon, makes use of multiple photons.
  • Article - 29 Sep 2023
    In this interview, AZoNano discusses the Unity - BEX imaging technique with Heithem Mansour and explores the features of Unity that make it an ultimate imaging technology.
  • Article - 24 Jul 2023
    Industrial metrology ensures the conformity and validity of production in any industry to meet global standards. This article demystifies the concept of industrial metrology and delves into its...
  • Article - 23 Nov 2023
    This article from Carl Zeiss details how nano-scale EDS analysis was accomplished in an SEM with a detector for transmission SEM.
  • Article - 22 Nov 2023
    This article from Carl Zeiss discusses voltage contrast in a microelectronic circuit.
  • Article - 27 Jun 2023
    This article provides an overview of metrology, exploring its historical roots, diverse techniques, and profound impact on shaping industries and enabling accuracy and precision in various fields.
  • Article - 2 May 2023
    The global transmission electron microscope market is rapidly expanding due to the increasing demand for analytical and structural characterization of nanostructured materials and is projected to...
  • Article - 28 Feb 2023
    In this article, nanomechanical measurements and their importance for the nanomechanical characterization of materials, specifically soft materials, are discussed.
  • Article - 17 Mar 2023
    In this article, the historical and future trends in the production and use of nanobiomaterials will be discussed.

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