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Results 131 - 140 of 1620 for Measuring Controlling Devices
  • Supplier Profile
    By 1970 the semiconductor industry had been building momentum for at least a decade. Yet the companies supplying the equipment and materials that made possible the miniature wonders known as...
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    Elcora is currently developing “Polymetallic” mining deposits like Vanadium, Manganese, Copper and soon Tantalum, Nobium and some other rare earth minerals. Founded in...
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    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
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    Protochips is the leader for in situ (real-world) electron microscopy products. The revolutionary systems include Atmosphere for pressurized gas and heating, Poseidon Select for liquid; electrical and...
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    For nearly 30 years, RJ Lee Group, Inc. has excelled at providing analytical services, technical consulting, information management, and expert testimony in materials characterization and...
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    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...
  • Article - 2 Mar 2011
    By integrating a Raman spectrometer within a state-of-the-art confocal microscope setup, Raman imaging with a spatial resolution down to 200 nm laterally and 500 nm vertically can be achieved using...
  • Article - 19 Aug 2008
    The Phenom is a new tabletop scanning electron microscope (SEM) which combines the high magnification of electron microscopy with the ease of use of optical microscopy to improve performance in a...
  • Article - 9 Dec 2005
    To meet the demands of ultra-precision positioning and scanning, a series of precision positioning mechanisms have been developed by Queensgate Instruments. They combine piezoelectric and NanoSensor...
  • Article - 2 Dec 2005
    Digital Piezo Translators (DPTs) are piezo-electric translation devices capable of moving up to 70 microns with very high linearity and essentially perfect repeatability. Other specifications are also...

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