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Results 131 - 140 of 219 for Microscopes
  • Equipment
    Hiden Analytical’s PSM is a plasma probe that measures some of the key plasma parameters and offers detailed information regarding plasma reaction chemistry.
  • Equipment
    ibss Group, in collaboration with a plasma source inventor, has developed an advanced in situ Asher called GV10x DS.
  • Equipment
    Probes for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0.6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be...
  • Equipment
    Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long...
  • Equipment
    The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4µm behind the free...
  • Equipment
    SensaProbes are highly recommended for early stage scans and student use. Applied NanoStructures SensaProbes can be used for tapping and contact mode and force modulation applications.
  • Equipment
    Applied Nanostructures Doped Diamond Probes offers a unique combination of hardness and conducting tip. These probes are nanofabricated using highly doped single crystal silicon with unparalleled...
  • Equipment
    Applied Nanostructures silicon nitride probes contains the world's first truly hybrid probes. They are also the only commercially available probes that allow for high resolution imaging in fluid...
  • Equipment
    Applied Nanostructures silicon probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force...
  • Equipment
    The new PI nano series nanopositioning stages feature a very low profile of 20 mm (0.8"), a large aperture and deliver highly accurate motion with sub-nanometer resolution in 2 and 3 axes.

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