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  • Article - 30 Nov 2020
    Since Richard Feynman, the physicist and Nobel Prize laureate, also known as the father of modern nanotechnology presented a famous lecture “There’s Plenty of Room at the Bottom” at the California...
  • Article - 14 Jul 2020
    Characterization of carbon nanotube-embedded polymers using C-AFM highlights nanoscale conductivity variations, crucial for advanced material applications.
  • Article - 15 Oct 2024
    Nanomaterials are any type of material of nanosized thickness, i.e. less than 100 nm in thickness. There are various types, many of which exhibit different properties than bulk materials.
  • Article - 25 Apr 2018
    Cleaving is a fast and simple method used for preparing samples of semiconductor materials, including silicon. In contrast, sapphire does not cleave well, despite being a single crystal.
  • Article - 30 Jun 2017
    SP-ICP-MS offers a rapid, accurate method for quantifying metallic contaminants in single-walled carbon nanotubes without digestion.
  • Article - 21 Oct 2015
    Imaging cells using a combination of AFM and optical techniques provides a better understanding of the structural constitution of their surface and helps with the functional labeling of specific...
  • Article - 8 Jan 2015
    Adam Kollin, President of RHK Technology, talks to AZoNano about the features and benefits of the Low Temp PanScan.
  • Article - 21 Feb 2014
    This article talks about the nanomanipulation and EBSD analysis of microelectronic gold wire.
  • Article - 24 Sep 2014
    Nanolithography is a field of nanotechnology which deals with the study and application of fabricating nanometer-scale structures. Since 2007, nanolithography has gained a high level of research...
  • Article - 2 Oct 2013
    Phenom-World recently launched the new generation of their flagship Phenom benchtop SEMs. AZoNano spoke to Phenom-World CEO Emile Asselbergs about the new Phenom, and the company's heritage and...

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