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  • Applied Nanostructures SensaProbes
    Equipment
    SensaProbes are highly recommended for early stage scans and student use. Applied NanoStructures SensaProbes can be used for tapping and contact mode and force modulation applications.
  • Applied Nanostructures Doped Diamond Probes
    Equipment
    Applied Nanostructures Doped Diamond Probes offers a unique combination of hardness and conducting tip. These probes are nanofabricated using highly doped single crystal silicon with unparalleled...
  • Applied Nanostructures Silicon Nitride Probes
    Equipment
    Applied Nanostructures silicon nitride probes contains the world's first truly hybrid probes. They are also the only commercially available probes that allow for high resolution imaging in fluid...
  • Applied Nanostructures Silicon Probes
    Equipment
    Applied Nanostructures silicon probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force...
  • Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations
    Equipment
    Carbon Design Innovations' (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized with...
  • X-Ray Inspection To Meet Chip Making Need - New Technology
    Article - 1 Dec 2003
    A decades-old, X-ray-based method for studying the atomic structure of materials may be the answer to a looming semiconductor industry need - a rugged, high-throughput technology for measuring...
  • Prof Dmitri Golberg
    Expert
    Dmitri Golberg has a wide background and strong command in the synthesis, electron microscopy, and physical property measurements of BN and other inorganic nanotubes. He was one of the first...
  • Prof Thomas Bjørnholm
    Expert
    Professor Thomas Bjørnholm (b. 1960), Director of Nano-Science Center at the University of Copenhagen since 2001, obtained his Ph.D. in materials chemistry in 1990. In 1992 he became...
  • Plateau Tip Silicon-SPM-Probes from NANOSENSORS
    Equipment
    The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a...
  • Coated AFM Tip - Extended Life High Aspect Ratio from Team Nanotec
    Equipment
    Tips are coated with conductive, wear resistent metal carbide. Smooth and well defined tip surface.

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