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Results 1601 - 1610 of 5226 for Measurements
  • Pointprobe- Silicon AFM Probes from Nanoworld
    Equipment
    The Pointprobe is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon...
  • Pyrex-Nitride Probe – Diving Board Cantilevers from Nanoworld
    Equipment
    The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4µm behind the free...
  • Applied Nanostructures SensaProbes
    Equipment
    SensaProbes are highly recommended for early stage scans and student use. Applied NanoStructures SensaProbes can be used for tapping and contact mode and force modulation applications.
  • Applied Nanostructures Doped Diamond Probes
    Equipment
    Applied Nanostructures Doped Diamond Probes offers a unique combination of hardness and conducting tip. These probes are nanofabricated using highly doped single crystal silicon with unparalleled...
  • Applied Nanostructures Silicon Nitride Probes
    Equipment
    Applied Nanostructures silicon nitride probes contains the world's first truly hybrid probes. They are also the only commercially available probes that allow for high resolution imaging in fluid...
  • Applied Nanostructures Silicon Probes
    Equipment
    Applied Nanostructures silicon probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force...
  • Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations
    Equipment
    Carbon Design Innovations' (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized with...
  • X-Ray Inspection To Meet Chip Making Need - New Technology
    Article - 1 Dec 2003
    A decades-old, X-ray-based method for studying the atomic structure of materials may be the answer to a looming semiconductor industry need - a rugged, high-throughput technology for measuring...
  • Prof Dmitri Golberg
    Expert
    Dmitri Golberg has a wide background and strong command in the synthesis, electron microscopy, and physical property measurements of BN and other inorganic nanotubes. He was one of the first...
  • Prof Thomas Bjørnholm
    Expert
    Professor Thomas Bjørnholm (b. 1960), Director of Nano-Science Center at the University of Copenhagen since 2001, obtained his Ph.D. in materials chemistry in 1990. In 1992 he became...

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