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Results 241 - 250 of 1076 for Atomic force microscopes
  • Veeco Instruments Establishes Endowed Chair at UC Santa Barbara
    News - 15 Oct 2008
    Veeco Instruments Inc. has established an endowed chair at UC Santa Barbara that will support the teaching and research of a pioneering scholar in engineering or the sciences. The Veeco Chair will...
  • IBM Marks Two Decades In Nanotechnology With More Nanotechnology Breakthroughs
    News - 3 Sep 2007
    Twenty years after two IBM scientists won the Nobel Prize in Physics for their invention of the Scanning Tunneling Microscope (STM), which opened the world to individual atoms for the first time,...
  • Tribology for Nanotechnology Applications
    Article - 18 Dec 2017
    Tribology is the study of interacting surfaces in motion and the measurement of properties such as friction, wear and abrasion. When designing nanoscale devices the consideration of tribology is...
  • High Performance SuperResolution Microscopes with PI Nanopositioning Stages - Witec
    Video
    Find out how WITec - a manufacturer of high-resolution near-field atomic force microscopes and confocal Raman systems - can provide superior instruments with nano-positioning technology from PI -...
  • Beetle UHV VT VMF from RHK
    Equipment
    The VT Beetle from RHK is the most thermally and mechanically stable of the many SPM designs with varying temperature that are currently available on the market.
  • Beetle UHV VT STM from RHK
    Equipment
    RHK’s VT Beetle is based on the field-proven “Johnny Walker” Beetle™ design. It is both thermally and mechanically stable compared to the many SPM designs with varying temperatures that are available...
  • Overview of Nanosurf's NaioAFM System
    Video
    This video provides an overview of the features and handling of the NaioAFM system. Nanosurf's NaioAFM is a compact atomic force microscope developed for nanoeducation and small sample measurements....
  • High Speed AFM Performance on Three Qualification Samples
    Video
    This video shows the high speed performance of the atomic force microscope (AFM) from Bruker on the three qualification samples. The tip-check, Celgard and calibration grating are the three standard...
  • DME Ultra-High Vacuum SPM - Versatile SPM for UHV
    Equipment
    Common UHV SPMs are very specialized and far behind the ease of use of today’s standard AFMs or SPMs.
  • Nanoscale Imaging Techniques: An Overview
    Article - 22 Jan 2013
    There are a wide range of nanoscale imaging tools that include microscopic methods such as scanning probe microscopy (SPM), electron microscopy (EM), high resolution optical microscopy as well as...

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