Search

Search Results
Results 271 - 280 of 1355 for METROLOGY
  • Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • Supplier Profile
    Navitar is a global optical technology leader that enjoys developing new and innovative optical products that help you stay ahead of your competition. For over thirty years, we have been making...
  • Supplier Profile
    Nova is a leading innovator and key provider of dimensional and materials metrology solutions for advanced process control used in semiconductor manufacturing. Nova provides its customers with the...
  • Supplier Profile
    Zurich Instruments is a test and measurement company based in Zurich, Switzerland, developing and selling measurement instruments and delivering customer support in key markets around the world,...
  • Supplier Profile
    LayTec develops, manufactures and markets optical in-situ and in-line metrology systems for thin-film processes with particular focus on compound semiconductor and photovoltaics applications. Our...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Article - 18 Aug 2022
    In this interview, Dr. Heiko Haschke, Director BioAFM Business, Bruker Nano Surfaces and Metrology Division talks to AZoNano about the company, the products they list and the research they carry out.
  • Article - 3 Dec 2021
    With nanotechnology, the potential of next-generation X-ray mirror metrology instruments may be promising for the advancement of X-ray nanoprobes.
  • Article - 10 Jul 2019
    The scientific field of metrology refers to the ability to obtain measurements of almost any type of object. How does nanometrology help in the analysis of biological materials?
  • Article - 1 Oct 2018
    The surface metrology expert at Digital Surf, François Blateyron, outlines what Scale-Sensitive Fractal Analysis is and how it is used.

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.