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  • Supplier Profile
    The NETZSCH Group is a mid-sized, family-owned German company engaging in the manufacture of machinery and instrumentation with worldwide production, sales, and service branches. The three Business...
  • Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
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    XiGo Nanotools was founded by Sean Race and Dr. David Fairhurst in 2005 with the mission to provide new innovate “tools” for the emerging nanomaterials industry. The Acorn Area is...
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    Liquid Instruments was founded by a team of experimental physicists and engineers with expertise in precision measurement and gravitational wave detector instrumentation. We provide equipment that...
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    TMC is a global leader in precision floor vibration isolation systems with over 50 years of experience. Major research centers, OEM and end-user semiconductor manufacturers, drug discovery companies,...
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    CSInstruments, a French manufacturer of scientific equipment, specializes in developing Atomic Force Microscopes (AFMs) and various accessories for existing AFMs, such as the Nano-Observer AFM,...
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    Flow meters and flow controllers by Brooks are a proven solution for flow measurement and flow control challenges. With more than 60 years of experience, Brooks brings Coriolis mass flow, thermal mass...
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    For more than 20 years, ZAHNER measurement systems have proven to be first choice for laboratory measurement equipment in various branches of university and industry research. The reason is the high...
  • Supplier Profile
    Andor Technology, an Oxford Instruments company, is a global leader in the pioneering and manufacturing of high performance scientific imaging cameras, spectroscopy solutions and microscopy systems...
  • Supplier Profile
    Aquila Instruments manufactures the nkd, the most advanced thin film measurement instrument available. The nkd provides non destructive analysis of film thickness, refractive index and absorption for...

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