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Results 321 - 330 of 1054 for Atomic force microscopes
  • New Approach to Microscopy Opens up the Wonders of the Molecular World
    News - 17 Mar 2009
    A new approach to microscopy is opening up the wonders of the molecular world, allowing researchers to examine organic molecules and delicate crystals as they grow, atom by atom. Dr Andrew Humhpris,...
  • Atomic-Sized One-Stop Shop for Nanoelectronics
    News - 19 Feb 2009
    University of Pittsburgh researchers have created a nanoscale one-stop shop, a single platform for creating electronics at a nearly single-atom scale that could yield advanced forms of such...
  • Visualization and Manipulation of Atoms Using Nanotechnology and AFM
    News - 9 Jan 2009
    An international team of scientists, among them researchers from the department of Theoretical Condensed Matter Physics of the Universidad Autónoma de Madrid (UAM), present a new method to...
  • World's Thinnest Balloon, Just 1 Atom Thick
    News - 20 Sep 2008
    Using a lump of graphite, a piece of Scotch tape and a silicon wafer, Cornell researchers have created a balloonlike membrane that is just one atom thick -- but strong enough to contain gases under...
  • NanoArt 2007 Competition Now Open for Online Voting
    News - 14 Jan 2008
    NanoArt is a new art discipline at the intersections of Art, Science and Technology, and relates to the micro or nanosculptures (atomic and molecular sculptures) created by artists or scientists...
  • Automation of Nanotech Manufacturing May Be Ahead
    News - 2 Aug 2007
    In an assist in the quest for ever smaller electronic devices, Duke University engineers have adapted a decades-old computer aided design and manufacturing process to reproduce nanosize structures...
  • Latest Trends in AFM
    Article - 27 May 2016
    Atomic force microscopy (AFM) was first used in 1986 and uses a cantilever with a sharp tip to scan across a sample to produce a topographic map. The process is now expanding its use over a range of...
  • Streamlining Sample Analysis with the Zetasizer Sample Assistant
    Equipment
    The Zetasizer Sample Assistant enhances the efficiency of sample analysis by automating and streamlining the preparation and handling process, ensuring precise and consistent measurements.
  • EDAX Pegasus: An EDS-EBSD System
    Equipment
    The EDAX Pegasus is an EDS-EBSD system for world-class materials characterization.
  • EDAX Trident (EDS-EBSD-WDS) System
    Equipment
    The EDAX Trident Analysis System offers a complete materials characterization solution.

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