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Results 81 - 90 of 964 for TEM
  • Article - 20 Nov 2023
    Nanomedicine has demonstrated great efficacy in delivering an array of therapeutic compounds into the body's target sites. Here, we discuss the application of TEM in nanomedicine for drug discovery...
  • Article - 4 Sep 2015
    Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are widely considered the gold standard for nanoparticle characterization. However, choosing which to employ is a complex...
  • Supplier Profile
    Sigma-Aldrich® is a leading high-technology company. Through our Materials Chemistry Centers of Excellence in research and manufacturing we develop advanced, enabling materials for your...
  • Article - 15 May 2023
    This article discusses the application of transmission electron microscopy (TEM) to analyze metal nanoparticles.
  • News - 20 Sep 2010
    As of today, the LIBRA series Transmission Electron Microscopes (TEM) from Carl Zeiss take a leap forward by offering the new ZEMAS framework technology (ZEISS Electron Microscopy Applications...
  • News - 13 Jul 2009
    TEMwindows.com is celebrating its six-month business anniversary by launching new products, exhibiting at the Microscopy and Microanalysis 2009 conference, and increasing its reach through three new...
  • Supplier Profile
    Xenocs is a leading provider of X-ray scattering equipment (SAXS/WAXS) for nanoscale characterization of materials. These systems are essential for research, development, and production in a wide...
  • Supplier Profile
    Strem Chemicals, Inc. established in 1964, is a privately–held company that manufactures and markets specialty chemicals of high purity. Its clients include academic, industrial and government...
  • Article - 5 Feb 2024
    TEM is pivotal for characterizing gold nanoparticles, revealing their assembly and aiding the development of advanced nanodevices.
  • Article - 16 Jun 2023
    Electron microscopy methods are very well-suited to imaging nanoscale structures and so likely to remain one of the main characterization techniques for 2D materials and their defects.

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