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The Latest Research in Nanoparticle Pollution Analysis

The Latest Research in Nanoparticle Pollution Analysis

Nanoparticles present a significant threat to human health across the globe as they contribute to air pollution and enter our lungs as we breathe.

By Sarah Moore 5 May 2021

Exoid: Izon Science's Next-Generation Nanoparticle Measurement Technology

Exoid: Izon Science's Next-Generation Nanoparticle Measurement Technology

Izon Science, a leading nanotechnology manufacturer, has announced its latest nanoparticle measurement system, the Exoid. The Exoid device measures complex nanoparticle information using next-generation Tunable Resistive Pulse Sensing (TRPS) technology.

From Izon Science 4 May 2021

How Nanotechnology is Leading the Way in Pollution Control

How Nanotechnology is Leading the Way in Pollution Control

Scientists at Oxford University have developed a new process based on nanotechnology to simplify and reduce the cost of testing water for chemical pollution and toxicity levels.

From Nanolyse Technologies 23 Apr 2021

Spectroscopic Ellipsometry: What is it?

Spectroscopic Ellipsometry: What is it?

Spectroscopic ellipsometry is an optical measurement method. It is utilized to measure the change in polarization of light when it travels through a medium. This then allows the extraction of the material properties of the medium.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

Scanning Probe Microscopy: What is it and Why is it Used

Scanning Probe Microscopy: What is it and Why is it Used

Scanning probe microscopy (SPM) is a powerful microscopy technique that allows for the imaging of surface structures at an atomic resolution with sample damage. SPM can also measure other characteristics, be they electrical or magnetic.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

Ellipsometric Porosimetry: What is it and Where is it Used?

Ellipsometric Porosimetry: What is it and Where is it Used?

Ellipsometric porosimetry is a technique to measure material thickness and optical property changes via the adsorption and desorption of volatile species. Highly sensitive, it is capable of measuring films up to 10 nm thin.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

Measuring Nanohardness via Nanoindentation

Measuring Nanohardness via Nanoindentation

Nanoindentation is a technique by which the mechanical properties of materials can be measured. Suitable for measurements on the nanoscale, the method allows for the measure of material nanohardness.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

Ellipsometry: Principles and Usage in Optics

Ellipsometry: Principles and Usage in Optics

Ellipsometry is an optical measurement method. Used in optics to analyze thickness and optical purpose for structural layers, it is a highly sensitive and accurate technique.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

Dielectric Film Measurement: What is it and Why is it Important?

Dielectric Film Measurement: What is it and Why is it Important?

This article discusses dielectric film measurement, why it is necessary, practical applications and the mathematical logic behind it.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

SEM, AFM, Correlative Microscopy and Heterostructure Analysis

SEM, AFM, Correlative Microscopy and Heterostructure Analysis

Semiconductors are made from heterostructures. SEM, AFM and correlative microscopy methods are all excellent for analyzing heterostructures.

From Semilab Semiconductor Physics Laboratory 1 Apr 2021

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