Microscopy News

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ICMS Selects FEI Company to Develop Unique Imaging Facility

Scaling the Technology Down Further into the Realm of Quantum Physics

Scaling the Technology Down Further into the Realm of Quantum Physics

New Instrument Combines Traditional Computer-Chip Technology with Microfluidics

New Instrument Combines Traditional Computer-Chip Technology with Microfluidics

BudgetSensors Introduce AFM Probes with 4 Different Cantilevers on a Single Holder Chip

Bacteria in Sewage Sludge Prevent Certain Nanoparticles Clumping Together

Bacteria in Sewage Sludge Prevent Certain Nanoparticles Clumping Together

Measuring Atomic Spacings Down to a Few Picometres

Measuring Atomic Spacings Down to a Few Picometres

Trapping Monolayer of Colloidal Particles in a Laser Lattice with Aperiodic Structure

Trapping Monolayer of Colloidal Particles in a Laser Lattice with Aperiodic Structure

Taking Images of Ice Nanometers Thick Opens Door to New Experiments

Taking Images of Ice Nanometers Thick Opens Door to New Experiments

CN Probes Executed Agreement with Leading MEMS Foundry

Graphene is the Strongest Material Ever Measured

Graphene is the Strongest Material Ever Measured

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