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Application Focussed Evolution of ZEISS EVO® SEM Series Pushing Limits in Materials and Life Science Microscopy

Carl Zeiss SMT presents at Microscopy & Analysis 2007 the newly designed and substantially improved EVO® MA and EVO® LS microscope series. These scanning electron microscopes (SEM) are introduced to meet the ...

From Carl Zeiss Microscopy GmbH 8 Aug 2007

ZEISS ULTRA plus - Breakthrough in Ultra-High-Resolution Imaging of Non-Conductive Samples

Carl Zeiss SMT presents at Microscopy & Analysis 2007 its newly developed “ULTRA plus” Scanning Electron Microscope (SEM) with unique technology for charge compensation of non-conductive samples. For the ...

From Carl Zeiss Microscopy GmbH 8 Aug 2007

FEI Launch Their Most Powerful Scanning Electron Microscopes Ever

FEI today introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM™ 30 series. This high-end, versatile field emission SEM series features new low kV performance for enhanced sur...

7 Aug 2007

Particle Sorting Demonstrated in a Custom Flowcell with Integrated Electrodes

Intelligent discrimination of target particles of interest from a complex liquid matrix is of critical interest in biodefense and homeland security applications. A miniaturized system for dielectrophoresis (DEP) based pa...

6 Aug 2007

Scientists Train Nano 'Building Blocks' To Take On New Shapes

Researchers from the University of Delaware and Washington University in St. Louis have figured out how to train synthetic polymer molecules to behave - to literally self-assemble - and form into long, multicompartment c...

6 Aug 2007

Imago Release New Family of Atom Probe Microscopes

Imago Scientific Instruments®, the world’s leading provider of atom probe microscopes, announced today the release of its new LEAP HR family of microscopes for a wide range of materials research applications. T...

5 Aug 2007

High-Dynamics XYZ Piezo Positioning Stage Scans Faster and More Accurately

PI (Physik Instrumente) L.P. a leading manufacturer of nanopositioning and piezo-based precision motion-control equipment for nanotechnology, photonics and semiconductor applications, offers a new 3-axis nanopositioning ...

3 Aug 2007

Porphyrin Electron Transfer Reactions Observed At The Molecular Level

Researchers at Temple University have observed and documented electron transfer reactions on an electrode surface at the single molecule level for the first time, a discovery which could have future relevance to areas su...

3 Aug 2007

TEM Control and Image Acquisition Software Available as Open Source Code from FEI

FEI and The Scripps Institute have announced that the Leginon™ software system, an advanced solution for automated control and image acquisition from a transmission electron microscope (TEM), will now be available ...

3 Aug 2007

Automation of Nanotech Manufacturing May Be Ahead

In an assist in the quest for ever smaller electronic devices, Duke University engineers have adapted a decades-old computer aided design and manufacturing process to reproduce nanosize structures with features on the or...

2 Aug 2007