Microscopy News

RSS

Precision Quantum Measurement Achieved with Weak-Measurement Techniques

Scientists who study the ultra-small world of atoms know it is impossible to make certain simultaneous measurements, for example finding out both the location and momentum of an electron, with an arbitrarily high level of precision. Because measurements disturb the system, increased certainty in the first measurement leads to increased uncertainty in the second.

5 Oct 2012

emc2012 Reports Huge Success, 30% Increase in Delegate Numbers

The 15th European Microscopy Congress - emc2012 - held at Manchester Central in September, was the largest yet in the series. It attracted 1,714 registered Conference Delegates. This is a 30% increase on 2008.

From Royal Microscopical Society 3 Oct 2012

New Microscopy Technique Monitors and Controls Etching Process on Nanoscale

A research team led by Professors Gabriel Popescu and Lynford Goddard from the University of Illinois has developed an inexpensive technique using a special kind of microscope to etch delicate features on the surface of semiconductors, while simultaneously monitoring the entire process in real time with nanoscale resolution.

29 Sep 2012

Epitaxial Thin Films Grown Coherently with Minimal Defects

An Oak Ridge National Laboratory research team has successfully grown epitaxial thin films with minimal defects. These films are used in fabrication of semiconductors and in nanotechnology applications. The researchers have discovered an elusive strain relaxation phenomenon in cobaltites which may lead to better energy-related materials, fuel cells, and magnetic sensors.

From Oak Ridge National Laboratory 24 Sep 2012

Carl Zeiss Microscopy Launches Orion NanoFab Multi-Ion Beam Tool at EMC

Carl Zeiss Microscopy introduced the ORION NanoFab at the European Microscopy Congress (EMC) in Manchester, UK. It is the first multi-ion-beam tool based on Gas Field Ion Source (GFIS) technology, offering interchangeable gallium, neon and helium ion beams.

From Carl Zeiss Microscopy GmbH 17 Sep 2012

University of Montana Becomes 1000th Customer of TESCAN’s VEGA-3 Variable Pressure SEM

TESCAN, a major manufacturer and provider of focused ion beam workstations and scanning electron microscopes, has announced the delivery of its 1000th VEGA-3 variable pressure scanning electron microscope to the Geosciences Department of the University of Montana.

From TESCAN Group 12 Sep 2012

NIST’s Hybrid Metrology Technique Can Reduce Uncertainties in Measurement of Computer Chip Features

National Institute of Standards and Technology (NIST) has devised a hybrid metrology technique that could reduce the uncertainties related to the measurement of features on the computer chip. The hybrid metrology technique is a combination of statistical analysis and scanning techniques.

From National Institute of Standards and Tech (NIST) 7 Sep 2012

Lenseless Imaging - the Future of Microscopy

A recent research study at the University of California in Los Angeles indicates lenseless imaging to be the future direction of high resolution microscopy. There have been significant advances made in the realm of lens-free computation imaging at the University of California over the years.

From University of California, Los Angeles 6 Sep 2012

Major Semiconductor Supplier Procures Multiple Bruker ContourGT-X 3D Optical Microscopes

Bruker has reported that a major semiconductor supplier has procured multiple Bruker ContourGT-X 3D optical microscopes for its packaging facilities located in North America and Asia to aid copper wire bond inspection and process control requirements.

31 Aug 2012

WITec Open Offices in Japan and Spain

WITec GmbH, worldwide leader in nano-analytical microscopy systems, continues to expand its worldwide presence with the opening of new regional offices in Japan and Spain.

From Oxford Instruments WITec 30 Aug 2012