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New Technique for Chemical Imaging of Nanoscale Materials

A team of researchers from the U.S. Department of Energy's Argonne National Laboratory and Ohio University have devised a powerful technique that simultaneously resolves the chemical characterization and topography of nanoscale materials down to the height of a single atom.

4 Dec 2014

New Orion Lightspeed Inspection System Detects Nano-Scale Defects Inside Semiconductor Materials

Altatech, a division of Soitec, has launched its newest inspection system, the Orion Lightspeed(TM), capable of pinpointing the size and location of nano-scale defects inside compound semiconductor materials and transparent substrates.

3 Dec 2014

Nanometrics Launches NanoSpec II Standalone Metrology System

Nanometrics Incorporated, a leading provider of advanced process control metrology and inspection systems, today announced the launch of its NanoSpec® II standalone metrology system, the latest model in its NanoSpec line of economic film metrology systems.

3 Dec 2014

Global Atomic Spectroscopy Market Forecast to Grow at 7.01% CAGR

Atomic spectroscopy is a technique used to analyze the elemental composition of an analyte by its electromagnetic or mass spectrum. This analysis is conducted with the help of spectral instruments by measuring the radiation intensity as a function of wavelength. The spectral instruments used in atomic spectroscopy are referred to as spectrometers or spectral analyzers.

3 Dec 2014

Scientists Capture High Resolution Pictures of Nascent Nanotubes

Researchers at the National Institute of Standards and Technology (NIST), along with Texas A&M and the University of Maryland, have successfully taken the first pictures of baby nanotubes when they were just a few atoms old. This collaborative study was carried out to better understand the factors that affect the formation of nanotubes. The results of the study have been published online in Nano Letters.

From National Institute of Standards and Tech (NIST) 2 Dec 2014

Nanoanalysis News

New Technique for Chemical Imaging of Nanoscale Materials

New Orion Lightspeed Inspection System Detects Nano-Scale Defects Inside Semiconductor Materials

Nanometrics Launches NanoSpec II Standalone Metrology System

Global Atomic Spectroscopy Market Forecast to Grow at 7.01% CAGR

Scientists Capture High Resolution Pictures of Nascent Nanotubes

Bruker Releases UMT TriboLab Mechanical Testing Platform

Launch of Nikon International Center of Microscopy and Excellence in Latin America

Imperia Photoluminescence System from Nanometrics for Production of Advanced Compound Semiconductors

New Tool to Generate Editable Models of Mid-Size Biological Structures

New Method Explains Structural Changes of Ultra-Short X-Ray Flashes

Revolutionary Nanofibers Made from Flour for Tissue Regeneration

A New Language for Nanopore Design

Enhancing Solid-State Lithium Batteries with Nano-Ceramic Electrolytes

Automated Image Acquisition and Analysis of Graphene and Hexagonal Boron Nitride Structures

Breakthrough in Broadband Photodetectors: Nanomaterial Gii Could Bring Faster Broadband and Higher Quality Medical Imaging

Conversations on AFM: Applications of BioAFM in Life Science

Conversations on AFM: The Technology and History Behind AFM and SPM

Recent Advances in High-Speed Atomic Force Microscopy to Improve Research Into Protein Dynamics

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