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In Situ Measurement of Film Thickness and Composition Now Possible with ThinFilmID

FEI Connectivity Solutions Reduce Wafers-to-Atoms Time From Days to Hours

First Nanostructures Ever Measured on Another Planet

First Nanostructures Ever Measured on Another Planet

Nanosurf Atomic Force Microscope Has Been Used on Mars by Phoenix Mars Lander

Nanosurf Atomic Force Microscope Has Been Used on Mars by Phoenix Mars Lander

One of the 100 Most Technologically Significant Innovations of the Year

One of the 100 Most Technologically Significant Innovations of the Year

Unique Research Facility to Study Trace Metals and Elements in Tissues

A Method for Imaging Nanoparticles Inside Cells

Details Confirmed for 7th Annual Symposium on the Applications of Scanning Probe Microscopy (SPM)

New Line of Lasers using Quantum Dot Materials for Biomedical Applications

PANalytical and Malvern Instruments Celebrate Opening of Their New Headquarters

PANalytical and Malvern Instruments Celebrate Opening of Their New Headquarters

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