Atomic Force Microscopes News

RSS

Researchers Develop New Kind of AFM Probe

Researchers at the McCormick School of Engineering and Applied Science at Northwestern University have developed, characterized, and modeled a new kind of probe used in atomic force microscopy (AFM), which images, measur...

10 Nov 2009

JPK Instruments Announces New Electrochemical Capabilities for NanoWizard AFM Systems

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce new electrochemical capabilities for their NanoWizard® AFM systems.

From Bruker BioAFM 27 Oct 2009

Scientists Image "Anatomy" of a Molecule using Noncontact Atomic Force Microscopy

IBM (NYSE: IBM) scientists have been able to image the "anatomy" -- or chemical structure -- inside a molecule with unprecedented resolution, using a complex technique known as noncontact atomic force microscopy.

28 Aug 2009

Carbon Design Innovations Awarded NIH SBIR Grant to Develop CNT AFM Probes

Carbon Design Innovations, Inc. (C|D|I) today announced that it has grant in the amount of $390,000 from the National Institutes of Health (NIH) Small Business Innovation Research (SBIR) Program.

From Carbon Design Innovations 11 Aug 2009

Veeco Launches Dimension Icon P-Series of Atomic Force Microscope Systems

Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs) to the nanoscience community, announced today the launch of its Dimension® Icon® P-Series of Atomic Force Microscope Systems.

21 Jul 2009

Asylum's Cypher Atomic Force Microscope Awarded R+D100 Award for 2009

Asylum Research and R+D Magazine have announced that Asylum's Cypher Atomic Force Microscope (AFM) has been awarded the R+D100 Award for 2009. Cypher is the first completely new small sample AFM/SPM in over a decade and is the world's highest resolution AFM.

20 Jul 2009

Carbon Nanotube-Based AFM Tips Promise Better Imaging

Carbon Design Innovations, Inc. (C|D|I) today announced the availability of two new atomic force microscope (AFM) probes types with carbon nanotube (CNT) tips. The CCHAR (carbon core high-aspect ratio) and CCHR (carbon core highresolution) CNT probes offer quantum improvements for AFM imaging, substantially improving results, reducing overall cost of operation and opening new avenues for research.

From Carbon Design Innovations 15 Jun 2009

ADT Announces Addition of Electrically Conductive and Dynamic Mode Probes for AFM

Advanced Diamond Technologies (ADT) announces two additions to its award-winning NaDiaProbe® family of all-diamond probes for atomic force microscopy (AFM)--electrically conductive and dynamic mode probes. Both varie...

8 May 2009

Simple and Inexpensive Molecular Technique that Replaces Expensive AFM

Chemists at the University of Illinois have created a simple and inexpensive molecular technique that replaces an expensive atomic force microscope for studying what happens to small molecules when they are stretched or ...

29 Mar 2009

Picoscale Stability in a Room-Temperature AFM

Forget dancing angels, a research team from the National Institute of Standards and Technology (NIST) and the University of Colorado (CU) has shown how to detect and monitor the tiny amount of light reflected directly off the needle point of an atomic force microscope probe.

24 Mar 2009