Atomic Force Microscopes News

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Semiconductor Manufacturer Embraces Veeco's New 3D Automated Atomic Force Microscope

Veeco Instruments Inc., announced today that its new InSight(TM) 3D Automated Atomic Force Microscope (3DAFM) Platform has been accepted by a key global semiconductor customer. The InSight is the only metrology system av...

30 Apr 2008

Simultaneous Measurement of Multiple Properties of Biomolecules and Materials With Fast Atomic Force Microscopy

New research demonstrates that novel probe technology based on flexible membranes can replace conventional atomic force microscopy (AFM) cantilevers for applications such as fast topographic imaging, quantitative material characterization and single molecule mechanics measurements

17 Apr 2008

Budget Sensors Adds DLC-Coated AFM Probes to Product Range

BudgetSensors, a Bulgarian manufacturer of silicon and silicon nitride probes, as well as AFM accessories for Atomic Force Microscopes (AFM), announces the introduction of a range of Diamond-Like-Carbon (DLC) coated AFM ...

9 Apr 2008

Veeco AFM to Probe Spintronics and other Small-Scale Electrical Measurements

The Veeco EnviroScope will be used by 'Unite mixte de Physique' (UMP), a joint laboratory between the French National Scientific Research Center (CNRS) and Thales Group for cutting-edge research into spintronics and other small-scale electrical measurements.

3 Apr 2008

Nanoscience Instruments has Launched a New Line of Silicon Nitride Probes for Atomic Force Microscopes

HYDRA series probes feature a unique, patent-pending design that combines low stress, silicon-nitride cantilevers with sharp Silicon tips in a variety of spring constants, they are ideal for applications ranging from highly sensitive force curve measurements to soft contact mode and gentle fluid tapping mode experiments.

14 Feb 2008