Atomic Force Microscopes News

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New Reference Samples Allow CD-AFM Tip Calibration with Uncertainty of Below 1nm

As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer capable of examining surface features, which can be just tens of nanometers. In order to examine these tiny features, researchers use tools such as the critical dimension atomic force microscope (CD-AFM), which measures features by dragging its ¡Ö10 nm tip across the subject¡¯s surface much like a record player needle pulling across a record¡¯s grooves.

31 Mar 2016

JPK Instruments NanoWizard® AFM family

The NanoWizard® AFM family answers the advanced and complex questions of tomorrow's research delivered TODAY. It provides specialized solutions e.g., for soft matter and life sciences applications (BioScience version), materials and polymer research (NanoScience version) or nano-optics applications (NanoOptics version).

From Bruker BioAFM 3 Feb 2016

Multiple uses for the JPK NanoWizard AFM System in the Smart Interfaces in Environmental Nanotechnology Group at the University of Illinois at Urbana-Champaign

Dr Rosa Espinosa-Marzal and members from her research group discuss results from their JPK NanoWizard® AFM system at the University of Illinois at Urbana-Champaign.

From Bruker BioAFM 20 Jan 2016

MIT Atomic Force Microscope Scans Images 2,000 Times Faster

Massachusetts Institute of Technology (MIT) engineers have designed a new atomic force microscope (AFM) that has the capability to scan images 2,000 times faster than models currently on the market. The microscope enables nearly real-time video of nanoscale chemical processes.

14 Dec 2015

Renishaw’s inVia confocal Raman microscope connects to Bruker’s Dimension Icon AFM

Renishaw is an experienced supplier of integrated Raman-AFM solutions, having offered them for over 16 years. The latest addition to the range of instruments it supports is Bruker’s Dimension Icon AFM.

30 Nov 2015

Scientists Develop Novel AFM Technique to Further Understanding of Ligand-Receptor Binding

A new high resolution method, that uses atomic force microscopy, has been developed that allows the exact shape of a receptor and it's affinity towards a particular ligand to be measured simultaneously. This has never been achieved before and will prove extremely useful in understanding the complex mechanisms behind cell communication.

19 Nov 2015

High-Speed AFM Reveals Deformation of Cell Membranes by Protein Complex

Cell membranes are very elastic. They can become distorted when they are asked to do so, when the cell divides, or when a virus detaches itself from the cell. In both cases, the membrane is deformed by a protein complex called ESCRT-III.

31 Oct 2015

Scientists Analyze Corneal Surface Nanopatterns in 23 Insect Orders Using Atomic Force Microscopy

In 1952, the legendary British mathematician and cryptographer Alan Turing proposed a model, which assumes formation of complex patterns through chemical interaction of two diffusing reagents. Russian scientists managed to prove that the corneal surface nanopatterns in 23 insect orders completely fit into this model.

22 Sep 2015

AFM and STM Help Identify Atomic Species at Surface of Anatase Titanium Dioxide

A NIMS research team successfully identified the atoms and common defects existing at the most stable surface of the anatase form of titanium dioxide by characterizing this material at the atomic scale with scanning probe microscopy. This work was published under open access policy in the online version of Nature Communications on June 29, 2015.

From National Institute for Materials Science 14 Sep 2015

Breakthrough Nanoscale IR Spectroscopy Platform Combines AFM-IR and sSNOM

Anasys Instruments, the world leader in nanoscale IR spectroscopy, announces the nanoIR2-s™ nanoscale spectroscopy and imaging platform.

14 Jul 2015

Atomic Force Microscopes News

New Reference Samples Allow CD-AFM Tip Calibration with Uncertainty of Below 1nm

JPK Instruments NanoWizard® AFM family

Multiple uses for the JPK NanoWizard AFM System in the Smart Interfaces in Environmental Nanotechnology Group at the University of Illinois at Urbana-Champaign

MIT Atomic Force Microscope Scans Images 2,000 Times Faster

Renishaw’s inVia confocal Raman microscope connects to Bruker’s Dimension Icon AFM

Scientists Develop Novel AFM Technique to Further Understanding of Ligand-Receptor Binding

High-Speed AFM Reveals Deformation of Cell Membranes by Protein Complex

Scientists Analyze Corneal Surface Nanopatterns in 23 Insect Orders Using Atomic Force Microscopy

AFM and STM Help Identify Atomic Species at Surface of Anatase Titanium Dioxide

Breakthrough Nanoscale IR Spectroscopy Platform Combines AFM-IR and sSNOM

Carbon Dioxide to 3D Printed Carbon Nanocomposites: A Sustainable Innovation

Emergent Quantum Phenomena in Self-Organized Graphene Systems

Calcium Carbonate Nanoparticles: Boosting T Cell Activation in Cancer Therapy

Feasibility Study with Evonik Confirms LEON’s FR-JET Technology’s Performance in Advanced Nanoparticle Manufacturing for Drug Delivery

GMG's THERMAL-XR Demonstrates Potential for Electronics Heat Sink Miniaturization and Efficiency

Conversations on AFM: Applications of BioAFM in Life Science

Conversations on AFM: The Technology and History Behind AFM and SPM

Recent Advances in High-Speed Atomic Force Microscopy to Improve Research Into Protein Dynamics

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