Atomic Force Microscopes News

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Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Researchers at the Department of Energy’s (DOE) Oak Ridge National Laboratory (ORNL) have discovered a new method to control friction in ionic solids at the nanoscale using ambient water vapor and electrical stimulation. Friction affects motion and hence frictional forces have to be controlled. Traditionally, lubrication or mechanistic means have been used for controlling friction forces.

From Oak Ridge National Laboratory 29 Jan 2015

Atomic Force Microscopy Etches Nanoscale Patterns on Conductive Polymers

Researchers at Oak Ridge National Laboratory (ORNL) have successfully carved out nanoscale designs on polymer surfaces using atomic force microscopy (AFM).

From Oak Ridge National Laboratory 18 Dec 2014

NIST Sensor May Help Sidestep Problems in Calibrating AFMs

Spotting molecule-sized features—common in computer circuits and nanoscale devices—may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).

18 Dec 2014

Bruker Releases BioScope Resolve™ Biological Atomic Force Microscope at Sixth AFM BioMed Conference

At the Sixth AFM BioMed Conference, Bruker today announced the release of BioScope Resolve™, a biological atomic force microscope (bioAFM) that features the highest resolution imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope (IOM).

From Bruker 17 Dec 2014

Oxford Instruments Launches Innovative Product for SEM-Based Particle Analysis

Oxford Instruments, the leading supplier of SEM-based particle analysis systems, has introduced its next generation particle analysis platform, AZtecFeature.

From Oxford Instruments NanoAnalysis 8 Dec 2014

Global Atomic Spectroscopy Market Forecast to Grow at 7.01% CAGR

Atomic spectroscopy is a technique used to analyze the elemental composition of an analyte by its electromagnetic or mass spectrum. This analysis is conducted with the help of spectral instruments by measuring the radiation intensity as a function of wavelength. The spectral instruments used in atomic spectroscopy are referred to as spectrometers or spectral analyzers.

3 Dec 2014

JPK Study Plant Cells at the University of Queensland using AFM

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of AFM and the CellHesion® module to study plant cell wall biology in the School of Chemical Engineering at the University of Queensland.

From Bruker BioAFM 25 Nov 2014

Scientists Uncover Structure of Pores in Cell Nuclei

The structure of pores found in cell nuclei has been uncovered by a UCL-led team of scientists, revealing how they selectively block certain molecules from entering, protecting genetic material and normal cell functions. The discovery could lead to the development of new drugs against viruses that target the cell nucleus and new ways of delivering gene therapies, say the scientists behind the study.

25 Nov 2014

Global Atomic Spectroscopy Market Forecast to Grow at 7.01 CAGR

24 Nov 2014

JPK Reports on the Application of the NanoWizard AFM System in Cancer Research at the ITAV Centre in Toulouse

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of the JPK NanoWizard® AFM system at ITAV, the Institut des Technologies...

From Bruker BioAFM 4 Nov 2014