Nanoelectronics News

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Uniquify Announces Development of DDR3 IP Solution for Samsung's Power-Efficient 28nm LPP Foundry Process

Uniquify today announced it developed a DDR3 intellectual property (IP) solution for Samsung Electronics' power-efficient 28nm LPP foundry process that is now in volume production for multiple product lines, including consumer and mobile applications.

29 Apr 2015

SEM Measurements are Affected by Variations in Gate’s 3D Shape During Nanoscale Chip Fabrication

As microchip feature dimensions approach atomic scale, it becomes formidably difficult to measure their size and shape. According to the International Technology Roadmap for Semiconductors, within the next couple of years the typical length of a transistor’s “gate” – its on-off switch – will be less than 20 nanometers (nm, billionths of a meter).

29 Apr 2015

Aehr Test Systems Announces Initial Order for FOX-15 Multi-Wafer Test and Burn-In Systems

Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order from a new customer for a FOX-15 Multi-Wafer Test and Burn-In System, multiple WaferPak™ contactors and a WaferPak Aligner.

28 Apr 2015

Georgia Tech Institute for Electronics and Nanotechnology Supports MEMS-Related R&D

Your smartphone likely uses a dozen or so tiny — yet powerful — MEMS sensors to support its sophisticated functions. And that late-model car undoubtedly carries scores of devices based on MEMS and other sensing technologies.

25 Apr 2015

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2015 Concludes Successfully

The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts from industry, government, and academia at the 2015 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN), which was held in Dresden, Germany, on April 14-16, 2015.

24 Apr 2015

Synopsys Announces New Extensions to its Open-Source Interconnect Technology Format

Synopsys, Inc. today announced new extensions to its open-source Interconnect Technology Format (ITF) which enable modeling of complex device and interconnect parasitic effects at the advanced 10-nanometer (nm) process node. The new extensions include modeling of variation effects due to multi-patterning technology (MPT).

From Synopsys, Inc. 22 Apr 2015

University of Cambridge to Acquire Veeco’s Propel GaN MOCVD System for Power Electronics

Veeco Instruments Inc. announced today that the University of Cambridge, one of the most highly regarded research universities in the world, has ordered the Propel™ Power Gallium Nitride (GaN) Metal Organic Chemical Vapor Deposition (MOCVD) System for GaN-on-silicon (Si) power electronics and light emitting diode (LED) research and development.

21 Apr 2015

Nanoelectronics News

Uniquify Announces Development of DDR3 IP Solution for Samsung's Power-Efficient 28nm LPP Foundry Process

SEM Measurements are Affected by Variations in Gate’s 3D Shape During Nanoscale Chip Fabrication

Aehr Test Systems Announces Initial Order for FOX-15 Multi-Wafer Test and Burn-In Systems

Georgia Tech Institute for Electronics and Nanotechnology Supports MEMS-Related R&D

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2015 Concludes Successfully

Synopsys Announces New Extensions to its Open-Source Interconnect Technology Format

University of Cambridge to Acquire Veeco’s Propel GaN MOCVD System for Power Electronics

Single Molecule Switches On Current Flow Using Light

Kulicke & Soffa Joins A*STAR IME’s High-Density Fan-Out Wafer Level Packaging Consortium

imec Awards Ovivo Contract to Provide Ultrapure Water Plant for New Nanoelectronics R&D Facility

Nanopore-Based Sensor Enables Rapid and Precise Disease Diagnosis

Multiscale Force Sensing with Photon-Avalanching Nanocrystals

Harnessing Biology for Sustainable Energy Production

Novel Method for Producing Superior Carbon Nanofibers via Additive Nanostructuring

Optimizing Methylene Blue Removal with Bovine Serum Albumin Nanoparticles

Conversations on AFM: Applications of BioAFM in Life Science

Conversations on AFM: The Technology and History Behind AFM and SPM

Recent Advances in High-Speed Atomic Force Microscopy to Improve Research Into Protein Dynamics

Sponsored Content

Characterization of Active Pharmaceutical Ingredients, Injectables, and Proteins

The Future of Wound Care: Why Nanofibers are Key to Accelerated Healing

The Evolution of Lipid Nanoparticles

How Emulsion Electrospinning is Transforming Materials