PI Extends Line of Nanopositioning Stages for Super-Resolution Microscopy

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May 1 2009

PI (Physik Instrumente) L.P. -- the inventor of Piezo-Z nanofocusing drives - has extended its line of piezo stages for super-resolution microscopy.

The new PI nano™ series nanopositioning stages feature a very low profile of 20 mm (0.8”), a large aperture and deliver highly accurate motion with sub-nanometer resolution in 2 and 3 axes. A piezo controller is included and comes with a 24-bit USB port, Ethernet, RS-232 and an analog interface, as well as solid software support for all major image acquisition packages. The piezo stage is supplemented by the optional M-545 manual XY microscope stage available in different versions for Olympus, Nikon, Zeiss and Leica microscopes.

Reduced Cost through Optimization for the Application
The PI nano™ series of piezo stages extends PI’s successful P-527, P-733 and P-563 series of capacitive direct-metrology nanopositioning stages. PI nano™ series systems were developed to provide high performance at lower cost, by adapting mechanics and controller exactly to the requirements of the target applications.

Improved Linearity with Special Controller
For highly stable, closed loop operation, piezoresistive sensors are applied directly to the moving structure and precisely measure the displacement of the stage platform. The very high sensitivity of these sensors provides optimum position stability and responsiveness as well as sub-nanometer resolution. The proprietary servo controller significantly improves the motion linearity compared to conventional piezoresistive sensor controllers.

Application Examples
Scanning Microscopy, Single Molecule Microscopy, 3D Imaging, Autofocusing, Scanning and Alignment Tasks in Bio-Nanotechnology.

More Information and Datasheet:
http://www.physikinstrumente.com/en/news/fullnews.php?newsid=157

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