Demonstration of EML 1310nm 40G Technology to be Offered by Sumitomo

Sumitomo Electric Industries, Ltd., a leading global provider of optical components and modules, and Anritsu Company, a global leader in optical test solutions, will be conducting a joint 40Gb/s technology demonstration in Anritsu’s booth – #3140 – during OFC/NFOEC 2010.

The demonstration will showcase Anritsu’s MP1800 BERT Signal Quality Analyzer and External 56G-MUX/DeMUX, and Sumitomo Electric’s 40G EML Laser and 40G Receiver.

The Sumitomo devices are XLMD MSA compliant. The XLMD MSA defines the electrical and optical interface specifications for 40Gbit/s pigtail optical devices supporting the emergence of the compact 40G transceiver module market for high-capacity networks and storage systems.

“The significance of this announcement is that it demonstrates the viability of extending the transmission distance of 40G serial transmission in a conventional single-mode environment, offering higher bandwidth per fiber,” said Masahiro Kobayashi, general manager of Lightwave Devices Division, Sumitomo Electric Device Innovations, Inc. “This demonstration paves the way for a rapid commercial development of 40G systems.”

The demonstration will feature Sumitomo Electric’s 40G EML Laser and 40G Receiver. The 40G EML is ideal for 43Gb/s serial applications and will be capable of distances up to 40 km with an integrated modulator driver IC. The 40G Receiver is housed in an 8-pin package with PIN and TIA and supports 30 GHz bandwidth.

Consisting of an MP1800 BERT Signal Quality Analyzer and MP1821A/MP1822A External 56G-MUX/DeMUX, Anritsu’s 40G test solution supports testing from 0.1Gbps to 56Gbps serial BERT with the 3.5Vp-p high-amplitude output and cross point adjustment. The solution provides the fastest Tr/Tf and minimum intrinsic jitter. The flexible and expandable configuration of the MP1800 BERT allows users to customize the system to fit their specific applications. The solution not only supports the 56G serial BERT but also 100G applications, such as CFP testing (25.78G x 4) and DP-QPSK.

Source: http://global-sei.com

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