Jun 5 2010
MicroProbe, a leading global supplier of probe cards to the semiconductor industry, today announced the release of an option for its Apollo vertical probe cards that provides compatibility with the Verigy V93000 Direct-Probe™ Solution.
The combination of the Verigy Direct-Probe™ Solution with MicroProbe's Apollo enables customers to significantly increase their digital test performance and coverage at wafer sort, accelerate yield learning data and speed time-to-market. In addition, it is a key enabler for Known-Good-Die (KGD) test models, where 100-percent functional test coverage at wafer sort is required.
The combination increases the wafer test coverage by optimizing the tester and probe card interface and eliminating unnecessary components to enhance signal integrity. This allows engineers to detect certain defects at a much earlier phase, during the wafer sort. Previously, this level of detection was only attainable during the final test stage, often resulting in weeks of lost yield-learning opportunity, and costly packaging and assembly operations performed on the bad die. With significant customer support, this early-detection solution has demonstrated significant cost savings and time-to-volume improvement.
"System-level optimization between the testers and probe cards is becoming increasingly mission critical for our customers in order to achieve the maximum yield entitlement," said Jorge Titinger, Verigy's Chief Operating Officer. "The Verigy Direct-Probe™ Solution in combination with MicroProbe's advanced probe cards for test cell optimization has demonstrated strong performance with wafer test cost-of-ownership advantages to our customers."
Mike Slessor, Chief Executive Officer at MicroProbe, said, "The combination of MicroProbe's advanced probe cards with the Verigy Direct-Probe™ Solution builds on our experience in delivering superior probe card products and collaborating with key ATE (Automated Test Equipment) partners such as Verigy. This tradition enables rapid delivery of integrated system-level solutions, enabling our customers to meet their cost and time-to-market objectives."
Compatibility with the Verigy Direct-Probe™ Solution is now available on MicroProbe's Apollo vertical probe card products, with a roadmap to support implementation on MicroProbe's advanced MEMS-enabled product families for flip-chip and fine-pitch wire-bond applications. For additional information, please contact your local sales representatives.
Source: https://www.advantest.com/