Jun 15 2010
McBain Systems has announced the first sale of its new DDR300 NIR (near infrared) Inspection System to one of the world’s largest semiconductor chip manufacturers. Installed in a fab in Kulim, Malaysia, the new Defect Detection and Review (DDR) station is being used to check for subsurface cracks and other defects that are hidden beneath layers of silicon and other semiconductor materials.
“The objective is to increase yields in our customer’s flip-chip devices,” stated McBain President and CEO, Michael Crump in making the announcement.
“By all accounts the DDR300 NIR has the highest resolution of all instruments in its class, which is why it’s able to deliver a sharper, clearer view of hard-to-detect subsurface defects.”
The new McBain system operates in the near-infrared spectral range between 900 nm and 1700 nm and can “see” through a range of silicon and other semiconductor materials, including those with rough surfaces.
The DDR300 NIR may be used for both micro- and macro-inspection, to view features from 1 micrometer to over 200 micrometers in size.
In addition, an image-stitching capability enables wide-field imaging in high resolution. Two models of the DDR system are available, for inspecting 200mm and 300mm wafers.
McBain has a 45-year track record in designing, engineering and manufacturing custom inspection systems for very specific applications.
“Near infrared subsurface inspection is a good example of how McBain is able to target a niche application and produce a very high-performance instrument more cost-efficiently than many of the larger manufacturers,” explained Mr. Crump.
McBain creates custom-engineered systems that address special optical imaging, inspection, analysis and metrology applications for a range of high-precision industries, from semiconductor to disk drive, medical device manufacturing to aerospace. These systems are sold worldwide.
In addition, McBain is the exclusive regional dealer for Leica microscopes for industrial applications across the Southwest and South Central U.S. regions, extending from Southern California through Louisiana.
Source: http://www.mcbaininstruments.com/