New Amorphous Silicon Digital X-Ray Detectors Provide High-Speed Real-Time Industrial Inspection

PerkinElmer Optoelectronics, a global technology leader in digital imaging, specialty lighting and optical detection technologies, today announced it will showcase its new high-speed, high-throughput, digital x-ray detectors at the 17th World Conference on Nondestructive Testing (WCNDT) at the Shanghai Exhibition Center in Shanghai, China. This will mark PerkinElmer's first exhibition in Asia of its digital imaging technologies for a range of industrial and medical applications, including pipeline inspection and diagnostic and therapeutic medical imaging. These technologies are an integral part of the Company's ongoing commitment to supporting health and environmental infrastructures in China.

PerkinElmer's new amorphous silicon (a-Si) digital x-ray detectors offer twice the output speed of previous designs, with output up to 30 fps, while maintaining an industry-leading 16-bit resolution and the ability to produce real-time images. The detectors are radiation-hardened and designed to withstand the demanding, high energy test environments found in 24x7 production lines, making them the ideal choice for NDT applications including pipeline inspection, metal casting inspection, composite materials inspection, PCB testing, and in-line manufacturing inspection.

“PerkinElmer has a steadfast commitment to China and is excited to exhibit our new a-Si digital x-ray detectors for industrial NDT applications at this important conference,” said Brian Giambattista, Ph.D., president, digital imaging for PerkinElmer. “We are pleased to be working to help China with critical real-time NDT applications such as oil pipeline welding inspections, industrial castings inspection, and NDT inspections to help make planes safer. Recent enhancements to our x-ray detectors offer our customers the opportunity to perform critical real-time inspections both efficiently and cost-effectively,” added Dr. Giambattista.

At WCNDT, PerkinElmer will showcase two models in its new XRD N ES Detector Series:

• XRD 1621 N ES (“enhanced speed”) - 16-inch detectors which provide up to 30 fps of real time images and are suitable for radiation energies from 20 keV to 15 MeV. They provide a pixel size of 200 µm and an image size of 2048 x 2048 pixels.
• XRD 0820 N ES – 8-inch detectors which provide up to 30 fps of real time images and are suitable for radiation energies from 20 keV to 450 keV. They provide a pixel size of 200 µm and an image size of 1024 x 1024 pixels. Options include a detector available with a carbon fiber cover to provide excellent image quality at low X-ray energy levels.

PerkinElmer has delivered more than 15,000 a-Si x-ray detectors worldwide for a range of industrial NDT as well as medical applications ranging from diagnostic radiography to radiotherapy for cancer treatment. PerkinElmer is able to support the needs of an expanding global market through its state-of-the-art manufacturing facilities located in Walluf, Germany and its newly expanded fab in Santa Clara, California, USA.

PerkinElmer representatives will be available for comment on its new digital x-ray detectors at booth C310, Shanghai Exhibition Center, Western Hall #1, 2nd Floor. For more information or to schedule an appointment, please contact Ms. Soo-Jin Pak, marketing manager, at [email protected] or +49 611 492 146.

PerkinElmer, Inc. provides environmental, food, and consumer product testing instrumentation, diagnostics tools and medical and industrial imaging to help improve the health and safety of the people of China and their environment. PerkinElmer has been partnering with China for more than 20 years and currently employs approximately 1,200 people in Shanghai, Beijing, Guangzhou, Chengdu, Wuhan, Shenyang and Shenzhen.