Dec 23 2008
Following its debut at the 2008 MRS Fall Meeting in Boston (December 1-5) and its second exposure to the public during the 2008 ASCB Annual Meeting in San Francisco (December 13-17), Nanosurf officially announced the release of its latest atomic force microscope (AFM), the easyScan 2 FlexAFM. With its electromagnetically actuated, flexure-based XY-scanner technology combined with a piezo-based Z-scanner, the FlexAFM offers highly linear, ultra-flat, and fast scanning performance, while at the same time providing Lateral Force and liquid measuring capabilities to its users. The unique technologies incorporated into the FlexAFM will form the basis of other AFM scan heads to emerge in the future, and will allow Nanosurf to greatly extend the range and capabilities of their AFM scanners.
At the MRS and ASCB, potential customers, interested visitors, and competitors alike gathered around Nanosurf's booths to catch a glimpse of the new FlexAFM scan head, and to see it in action during live demos at both events. Everyone was impressed by its features - particularly by the flat, linear, and fast performance of the new flexure-based scanner technology - and by the way the new microscope is able to make measurements of samples submerged in liquid seem as trivial as measuring them in air. "There really is no difference to the user", says Ola Modinger, Nanosurf's Head of Sales & Marketing, who was proud to be present during the product launch at these two major US events. "It was impressive to see the massive interest in our new AFM, and to see how well people responded to the AFM's performance and to our well-implemented handling of samples in liquid". It is this "ease of use" - a feature common to all of Nanosurf's products - in combination with the new liquid and Lateral Force measuring mode capabilities of the FlexAFM scan head that will open up whole new markets in Materials and Life Science for Nanosurf's easyScan 2 product line.