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  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Thermo Fisher Scientific Phenom-World BV
    Supplier Profile
    Phenom. Making SEM personal Phenom, world’s fastest Desktop Scanning Electron Microscope takes your imaging performance to a higher level. The Phenom desktop scanning electron microscope...
  • ASML Special Applications
    Supplier Profile
    ASML is a world leader in the manufacture of advanced technology systems for the semiconductor industry. The company offers an integrated portfolio for manufacturing complex integrated circuits (also...
  • Danish Micro Engineering A/S
    Supplier Profile
    DME - Danish Micro Engineering A/S is one of the oldest manufacturers of Scanning Probe Microscopes (see History of DME) and since 1989 active in nanotechnology. Our instruments are characterized by...
  • Raith
    Supplier Profile
    Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, focused ion beam fabrication, nanoengineering and reverse engineering applications. Customers...
  • Carl Zeiss Microscopy GmbH
    Supplier Profile
    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
  • Schott AG
    Supplier Profile
    International technology group SCHOTT produces high-quality components and advanced materials, including specialty glass, glass-ceramics, and polymers. Many SCHOTT products have high-tech applications...
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Nanocharacterization Using Scanning Capacitance Microscopes (SCM)
    Article - 26 May 2005
    Scanning Capacitance Microscopes (SCM) and Scanning Probe Microscopes (SPM) can be used to study Metal Oxide Semiconductor (MOS) structures. This article looks at the fabrication of short and long...
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...

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