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  • News - 11 Sep 2007
    ATEN Technology, Inc., an innovator of high-quality KVM (keyboard/video/mouse) and remote connectivity products to centrally manage servers, network devices and IT infrastructure, today unveiled the...
  • News - 2 Jul 2007
    Xradia, Inc., a developer and manufacturer of ultra-high-resolution x-ray imaging systems for 3D tomography and nanotechnology applications, today announced the sale of three of its MicroXCTTM 3D...
  • Video
    The movie shows a high-resolution transmission electron microscopy study of the structure and dynamics of graphene at the edge of a hole in a suspended, single atomic layer of graphene. The injection...
  • Video
    This video outlines a new approach to carving nanomaterials atom by atom using a scanning transmission microscope.
  • Supplier Profile
    Zygo is a global leader in the design and manufacture of advanced metrology systems and ultra-precise optical components and assemblies. Our mission is to enable customer success by delivering...
  • Supplier Profile
    Nanomatrix Materials is a nano and advanced material manufacturer which uses proprietary disruptive graphene technology and its integration into smart applications. NM Material is an Indian...
  • Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Supplier Profile
    Ted Pella, Inc. is a manufacturer and distributor of high quality consumables, supplies and specimen preparation tools for all disciplines in science and industry, including: Nanoparticles, either...
  • Supplier Profile
    Nanocyl SA is the world leader in the commercialization and production of industrial multi-walled carbon nanotubes (MWCNT) and conductive masterbatches. The Belgium-based company was founded in 2002....
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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