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Results 111 - 120 of 1355 for METROLOGY
  • Mad City Labs Nano-HS Series Nanopositioning Systems
    Equipment
    The Nano-HS Series is a high speed, multi-axis, precision nanopositioning system with picometer positioning resolution. Offering maximum versatility, the Nano-HS can be configured to provide XY or XYZ...
  • Prior Scientific Instruments Ltd.
    Supplier Profile
    From our UK Headquarters, Prior Scientific designs and manufactures a wide range of scientific instrumentation, specialising in microscope automation and optical microscopy. This has been the core of...
  • Nova Measuring Instruments
    Supplier Profile
    Nova Measuring Instruments Ltd. is a leading global semiconductor equipment manufacturer with solutions and services that are used by 21 of the largest 25 IC manufacturers. Nova's expertise in...
  • Quantum Precision Instruments Asia Private Limited
    Supplier Profile
    QPI is developing a patented technology platform of atomic precision positioning metrology devices for microelectronics and sensors for use in medicine, bio-technology, aviation, defence, automotive,...
  • SEMATECH to Host Workshop on 3D Interconnect Metrology
    News - 4 Jun 2009
    To gain a better understanding of how new and existing wafer metrology technologies can be used, modified, or enhanced to measure and improve 3D interconnect processes, SEMATECH will host a workshop...
  • Park Systems
    Supplier Profile
    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
  • Nanometrics Unveils Turnkey Overlay Metrology Solution for Advanced IC Manufacturing
    News - 1 Mar 2011
    Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology, today announced the launch and delivery to a leading Asian memory customer of the Mosaic™ II,...
  • Nanoscience and Nanotechnology Research Group
    Supplier Profile
    We are a nanoscience and nanotechnology research group in the School of Materials Science and Engineering of the Georgia Institute of Technology. Our recent research is focused on the fundamental...
  • Peak Metrology and Digital Surf Launch Advanced Profilometry Software for Precision Surface Analysis
    News - 7 Feb 2025
    Peak Metrology, automated metrology equipment designer and manufacturer, and Digital Surf, editor of analysis software solutions for profilometry, microscopy and spectroscopy, have announced the...
  • Highly Dynamic 4DOF Piezo Wafer Stage for Inspection and Metrology, new from PI
    News - 11 Jul 2024
    Leveraging decades of piezo nanopositioning technology experience, introducing at 2024 Semicon West. Auburn, MA – PI’s newest wafer inspection solution is based on a hybrid kinematics...

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