Search

Search Results
Results 11 - 20 of 1054 for Atomic force microscopes
  • Anton Paar GmbH
    Supplier Profile
    Anton Paar Great people | Great instruments The “Anton Paar” success story began on January 4, 1922, when Anton Paar started his metalworking shop. Back then, it was hard to imagine that...
  • AFM Workshop
    Supplier Profile
    The mission of AFM Workshop is to develop and market innovative AFM products and components for research, development, OEMs and education. They support their customers with workshops on the...
  • The Single-Chip Atomic Force Microscope
    Article - 9 Aug 2016
    Dr. Neil Sarkar, President and Co-Founder of ICSPI and Duncan Strathearn, Director of Product Development at ICSPI talk to AZoNano about the world's first Mircroscopic Microscope, the new Single-Chip...
  • Nanoworld AG
    Supplier Profile
    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in Europe. Using...
  • Rensselaer Polytechnic Institute
    Supplier Profile
    In September 2001, NSF selected Rensselaer as one of the six original sites nationwide for a new Nanoscale Science and Engineering Center (NSEC). As part of the U.S. National Nanotechnology...
  • Atomic Force Microscope (AFM): WITec alpha300 A
    Equipment
    Find out about this Atomic Force Microscope (AFM) and its high-resolution samples for life sciences, materials research, and nanotechnology.
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Minus K Technology
    Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • AFM Probe with High-Q Factor for UHV Applications from Nanosensors - New Product
    Article - 28 Oct 2005
    Nanosensors have announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and enhanced signal to noise ratio for UHV applications. Posted October 28 2005
  • NaioAFM - All-in-One Atomic Force Microscope
    Equipment
    Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and...

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback