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Results 11 - 20 of 32 for Defect analysis
  • CRAIC Technologies
    Supplier Profile
    CRAIC Technologies manufactures superior microspectrophotometers for science and industrial applications. We specialize in the UV, visible and NIR regions and pride ourselves in making the finest...
  • Zygo Corporation
    Supplier Profile
    Zygo is a global leader in the design and manufacture of advanced metrology systems and ultra-precise optical components and assemblies. Our mission is to enable customer success by delivering...
  • Gatan, Inc.
    Supplier Profile
    Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are...
  • Attolight
    Supplier Profile
    Attolight, a Swiss company that originated in the EPFL Laboratory of Quantum Optoelectronics (LOEQ), has revolutionized micro-cathodoluminescence (CL).  Capitalizing on core expertise in the...
  • Hiden Analytical
    Supplier Profile
    2022 marks Hiden Analytical’s 40th year of continuous and independent operation in the field of mass spectrometry.  Driven by customer and application focussed innovation, a unique and...
  • Thermo Fisher Scientific - Vibrational Spectroscopy
    Supplier Profile
    Thermo Fisher Materials and Structural Analysis products give you outstanding capabilities in materials science research and development. Driving innovation and productivity, our portfolio of...
  • Merck
    Supplier Profile
    Our pursuit is progress for people everywhere. That's why we take a closer look at things, ask questions, and think ahead. We've been around for more than 350 years, yet our majority owners...
  • Asylum Research - An Oxford Instruments Company
    Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
  • Oxford Instruments NanoAnalysis
    Supplier Profile
    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...
  • XEI Scientific
    Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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