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Results 211 - 220 of 1154 for SEM
  • MVA Scientific Consultants, Inc
    Supplier Profile
    MVA Scientific Consultants is an analytical microscopy laboratory that provides transmission electron microscope (TEM) and scanning electron microscope (SEM) imaging services to raw material...
  • Structure Probe, Inc.
    Supplier Profile
    Structure Probe, Inc. was founded in April, 1970 by Charles A. Garber, Ph. D., who was President and Chief Executive Officer of the firm until his death in September 2007. Mrs. Violet Garber is the...
  • Leica Microsystems GmbH
    Supplier Profile
    Leica Microsystems is a world leader in microscopes and scientific instruments. Founded as a family business in the nineteenth century, the company’s history was marked by unparalleled...
  • Imina Technologies SA
    Supplier Profile
    Imina Technologies SA is born from the idea that conventional nanopositioning instruments used by scientists at the forefront of nanotechnology research are lacking of versatility to quickly adapt to...
  • Nanotech Digital GmbH
    Supplier Profile
    Nanotech Digital GmbH develops semiconductor equipment and process technology and graphene application. In thin film and semiconductor processing area is our main field. Flexible Transparent...
  • LatticeGear
    Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • EM ACE600 Sputter Coater: Sample Preparation of Thin Films
    Equipment
    Leica’s EM ACE600 sputter coater is the perfect instrument for the preparation of the thin films required for accurate and reliable electron microscopy.
  • Nanofiber-Hydrogel Treatment for Spinal Cord Injury
    News - 4 Apr 2022
    Novel research on nervous tissue repair has emerged from the MDPI journal, Cells, through the use of mesenchymal stromal cells and a nanofiber hydrogel composite. This research may be applied to...
  • Electron Beam Induced Contamination: How to Achieve Active Monitoring and Control
    Article - 13 May 2021
    Contamination also results from hydrocarbons brought into the proximity of the electron beam by the specimen itself. The extent of the problem could be revealed by regular contamination rate...
  • Novascan Technologies, Inc.
    Supplier Profile
    Novascan Technologies Designs, Manufactures and Sells tools for Semiconductor, AFM, SEM and TEM as well as Biological and Chemical Applications. We offer the best time tested yet modestly priced...

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