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Results 321 - 330 of 5225 for Measurements
  • Nanosensors
    Supplier Profile
    Founded by Nanotechnology pioneer Dr. Olaf Ohlsson, Nanosensors heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy). For more than ten years...
  • Zyvex
    Supplier Profile
    Zyvex is the first molecular nanotechnology company. They carry out scientific breakthroughs into key commercial applications in the areas of Materials, Tools and Structures. Zyvex has developed...
  • Why is Stress Measurement Critical in Thin Film Research?
    Article - 16 Feb 2024
    Accurate stress measurement in thin films is crucial for the performance and reliability of products in various high-tech industries.
  • What is Metrology?
    Article - 27 Jun 2023
    This article provides an overview of metrology, exploring its historical roots, diverse techniques, and profound impact on shaping industries and enabling accuracy and precision in various fields.
  • SAXS Measurements to Compare Lipid Nanoparticles With and Without RNA
    Article - 26 Sep 2023
    In this article, Xenocs explains how SAXS measurements can be used to observe structural differences between lipid nanoparticles with and without RNA, with many exciting applications in the drug...
  • Nanomechanical Measurements on Soft Materials
    Article - 28 Feb 2023
    In this article, nanomechanical measurements and their importance for the nanomechanical characterization of materials, specifically soft materials, are discussed.
  • Taking Measurements at the Nanoscale with Optical Rulers
    Article - 8 Feb 2023
    The optical ruler is an electromagnetic analog of a traditional, physical ruler but the key difference is an optical ruler is capable of making measurements at the nanoscale.
  • SMM Measurements of a Capacitance Standard Sample
    Article - 18 Jan 2023
    SMM reveals semiconductor dopant types and densities in Infineon silicon calibration sample, outperforming SSRM and SCM in sample integrity and data.
  • Capacitance Measurements with Scanning Microwave Microscopy (SMM)
    Article - 18 Jan 2023
    Scanning Microwave Microscopy (SMM) enables subsurface imaging for nano-electrical characterization, crucial for modern multilayered circuits.
  • Depolarized Dynamic Light Scattering (DDLS) Application for Particles Size Measurement
    Article - 16 Dec 2024
    This article describes the use of Depolarized Dynamic Light Scattering to analyze anisotropic nanoparticles that can be used in medical fields.

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