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  • Supplier Profile
    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
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    Alemnis enables breakthrough academic research in material science by providing leading-edge micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing...
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    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
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    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
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    The University's other world-class, multi-million pound centre will see industry-led development in graphene applications in partnership with academics. The Graphene Engineering Innovation...
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    Metrohm is one of the world’s most trusted manufacturers of high-precision instruments for chemical analysis. Metrohm was founded in 1943 by engineer Bertold Suhner in Herisau, Switzerland....
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    Specac manufactures an extensive range of FTIR Accessory, IR Polarizer, and Pellet Press Products for Atomic and Molecular Spectroscopy. These products include ATR Accessories, Specular Reflectance...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...
  • Supplier Profile
    Since our inception in 1978 we have been providing leading edge instrumentation for the field of particle size analysis. We are an applications driven company that provides solutions to our...
  • Supplier Profile
    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...

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