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Results 71 - 80 of 770 for Scanning probe microscopy
  • Ambios Technology Q-View SPM/Interferometer - Capabilities
    Video
    Rick Olds from Ambios Technology shows us through the Q-View. The Q-View which combines scanning probe microscopy (SPM) and interferometer which are interchangeable for taking surface roughness and...
  • FormFactor
    Supplier Profile
    FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design debug, to qualification...
  • Fischione Instruments
    Supplier Profile
    Fischione Instruments operates from its 24,000 square foot facility located 25 miles east of the city of Pittsburgh. Fischione utilizes state-of-the-art technology in its applications, engineering,...
  • SEMI
    Supplier Profile
    By 1970 the semiconductor industry had been building momentum for at least a decade. Yet the companies supplying the equipment and materials that made possible the miniature wonders known as...
  • Oxford Instruments Nanoscience
    Supplier Profile
    Creating high performance cryogenic and cryogen free environments for ultra low temperature and high magnetic field applications in physics, chemistry and materials science research down to the atomic...
  • Cranfield University - Nanotechnology Centre
    Supplier Profile
    The Microsystems and Nanotechnology Centre, within the Materials Department, was established in 1994 by Professor Whatmore. Since then it has grown to 50 staff and students. The Head of Centre is Dr...
  • Nanoworld AG
    Supplier Profile
    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in Europe. Using...
  • Novel Imaging Technique Takes High Resolution 3D Images of Cells
    News - 11 Nov 2021
    A team of researchers at the Swiss Federal Institute of Technology has developed a high-performance Scanning Ion Conductance Microscope (SICM) using the latest advances in nanopositioning, nanopore...
  • Superior Research Performance and Versatility with the Innova Scanning Probe Microscope
    Article - 29 Apr 2008
    The Innova scanning probe microscope (SPM) from Bruker delivers high resolution scanning, excellent value, and a wide range of functionality for physical, life, and materials sciences.
  • Design and Characterisation of an Ultra-Precision X-Y Stage – The NPS-XY-100A
    Article - 8 Dec 2005
    This paper describes the design of an ultra-precision xy positioning and scanning stage the Queensgate NPS-XY-100A. Special emphasis is placed on the design concept and metrological considerations....

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