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Results 81 - 90 of 4582 for Microscopes
  • Semplor
    Supplier Profile
    Semplor is an innovative high-tech company based in Eindhoven, The Netherlands. Eindhoven is the crucible of Electron Microscopy with its origins at Philips Electron Optics during the middle of the...
  • Leica Microsystems GmbH
    Supplier Profile
    Leica Microsystems is a world leader in microscopes and scientific instruments. Founded as a family business in the nineteenth century, the company’s history was marked by unparalleled...
  • Zygo Corporation
    Supplier Profile
    Zygo is a global leader in the design and manufacture of advanced metrology systems and ultra-precise optical components and assemblies. Our mission is to enable customer success by delivering...
  • Mad City Labs: Nanopositioning, Nanopositioners
    Supplier Profile
    Mad City Labs, Inc is a leading manufacturer of flexure based nanopositioning systems capable of sub-nanometer positioning resolution. Our product line covers the entire spectrum of nanopositioning...
  • Trends and Forecast Report on Global Life Science Microscopy Devices Market
    News - 28 Feb 2015
    Microscopes have enabled researchers to conduct in-depth academic and exploratory research. Increasing interest in life science areas such as nanoscience, and pharmacology and toxicology has created a...
  • 3D Imaging and Metrology for Data Storage Applications
    Article - 10 Oct 2011
    Data storage design demands extreme requirements on hard disks and other components. The Zeta-20 3D Imaging and Metrology Microscope measures the parameters that ensure high performance of disk drives...
  • Analysing LCD Display Colour Masks Using Transmission Microspectroscopy
    Article - 28 Apr 2008
    CRAIC Technologies is the worlds leading developer of UV-visible-NIR range scientific instruments for microanalysis. This article looks at pixel-to-pixel variations of color masks by transmission...
  • AFM Probe with High-Q Factor for UHV Applications from Nanosensors - New Product
    Article - 28 Oct 2005
    Nanosensors have announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and enhanced signal to noise ratio for UHV applications. Posted October 28 2005
  • Scanning Tunneling Microscopes - Future Developments
    Article - 12 May 2004
    In the early 1980s, Gerd Binning and Heinrich Rohrer developed the scanning tunneling microscope (STM) at the IBM Zurich Research Laboratory.
  • A Guide to Atomic Force Microscopy (AFM) and Transmission Electron Microscopy (TEM)
    Article - 2 Mar 2004
    This article discusses the similarities and differences between atomic force microscopy (AFM) And transmission electron microscopy (TEM).

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