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Results 1 - 10 of 214 for AFMs
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • CSInstruments
    Supplier Profile
    CSInstruments, a French manufacturer of scientific equipment, specializes in developing Atomic Force Microscopes (AFMs) and various accessories for existing AFMs, such as the Nano-Observer AFM,...
  • ICSPI (Integrated Circuit Scanning Probe Instruments)
    Supplier Profile
    Founded in 2007, our mission at ICSPI is to expand access to nanoscale measurement tools. We make desktop atomic force microscopes (AFMs) with unmatched time-to-results, ease of use and...
  • Nanoworld AG
    Supplier Profile
    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in Europe. Using...
  • AFM Workshop
    Supplier Profile
    The mission of AFM Workshop is to develop and market innovative AFM products and components for research, development, OEMs and education. They support their customers with workshops on the...
  • Nanosurf AG
    Supplier Profile
    Nanosurf: Zoom into the future Nanosurf is a company that thrives on challenges at the frontier of what is physically achievable. By concentrating our collective efforts on the obstacles that stand...
  • Bruker Introduces NanoMechanics Lab for Dimension AFMs
    News - 17 Oct 2017
    Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization,...
  • Bruker Introduces Scanning Microwave Impedance Microscopy for Dimension Icon AFMs
    News - 18 May 2016
    PeakForce sMIM Mode Provides Enhanced Nanoscale Mapping of Permittivity and Conductivity Bruker’s Nano Surfaces Division today announced the release of scanning microwave impedance microscopy...
  • NIST Sensor May Help Sidestep Problems in Calibrating AFMs
    News - 18 Dec 2014
    Spotting molecule-sized features—common in computer circuits and nanoscale devices—may become both easier and more accurate with a sensor developed at the National Institute of Standards...
  • Researchers from Université de Paris-Sud and CNRS Montpellier Use JPK AFMs to Characterize Living Bacteria
    News - 16 Jul 2013
    JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on how researchers from the Université de Paris-Sud and CNRS...

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