Search

Search Results
Results 1 - 10 of 37 for Erosion control
  • Sequoia Pacific’s SoilSET Finalist for 2004 Utah Innovation Award - News Item
    Article - 7 May 2004
    Sequoia Pacific Research Company (Sequoia Pacific) today announced its SoilSET has been named one of three finalists for the 2004 Utah Innovation Awards in the chemicals, pharmaceuticals and...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Strem Chemicals
    Supplier Profile
    Strem Chemicals, Inc. established in 1964, is a privately–held company that manufactures and markets specialty chemicals of high purity. Its clients include academic, industrial and government...
  • Semicore Equipment, Inc.
    Supplier Profile
    Semicore is a manufacturer and worldwide supplier for the electronics, optical, solar energy, medical, automotive, military and related high technology industries. Our high-performance production or...
  • Image Metrology A/S
    Supplier Profile
    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...
  • Faculty of Materials Science and Engineering Warsaw University of Technology
    Supplier Profile
    provides the best education in the field of study Materials Engineering in Poland Faculty of Materials Science and Engineering at the Warsaw University of Technology has once again been chosen the...
  • KLA Corporation
    Supplier Profile
    The future is ours to create. Whether it’s a driverless car, VR experience, or factory robotics, we help turn theory into possibility. We help create technological devices and ideas that...
  • Migration to Copper for High End Memory Devices Continues to Grow Relying on Tighter Process Control
    News - 7 Jul 2009
    Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market today...
  • Optical Critical Dimension Metrology Solutions Introduced in New Software from Nanometrics
    News - 31 Jan 2008
    Nanometrics Incorporated, a leading supplier of advanced metrology equipment to the semiconductor industry, today introduced NanoCD Suite.  This new product suite is composed of four key optical...
  • New Insights into Control of Plasma Behavior with Ultra-Thin Lithium Films on Graphite
    News - 1 Feb 2013
    The research of a multi-institutional team from the U.S., Japan, and France, led by Predrag S. Krstic of the Joint Institute for Computational Sciences and Jean Paul Allain of Purdue University has...

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback