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Results 1 - 10 of 2998 for Wafers
  • Supplier Profile
    LatticeGear is passionate about sample preparation and the under appreciated art of scribing and cleaving.   They help their customers get to the business of imaging and analysis faster. Their...
  • Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Supplier Profile
    Dynatex International has been the leader in dry process dicing and wafer dicing materials since 1958. We are committed to provide solutions for die/diode dicing and wafer processing applications --...
  • Supplier Profile
    SUSS MicroTec is one of the world's leading manufacturers of production and test equipment in the field of microelectronics. Our products are geared towards market segments for high-quality...
  • Equipment
    The DXB is used for mounting wafer to substrate improves bond quality and repeatability while improving process time during lapping, polishing, or dicing.
  • Supplier Profile
    PI is a privately held company that designs and manufactures world-class precision motion and automation systems including air bearings, hexapods, and piezo drives at locations in North America,...
  • Supplier Profile
    k-Space specializes in in-situ, real-time thin-film process monitoring tools. Since 1992 we have been developing quality integrated systems engineered to customer input and feedback. Our suite of...
  • Supplier Profile
    From our UK Headquarters, Prior Scientific designs and manufactures a wide range of scientific instrumentation, specialising in microscope automation and optical microscopy. This has been the core of...
  • Video
    This video talks about wafer stealth dicing and motion control for laser based semiconductor wafer dicing.
  • Supplier Profile
    Supporting advanced research since 1968, Lake Shore Cryotronics is a leading innovator in measurement and control solutions for materials characterization under variable temperature and magnetic field...

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