AFM excels in measuring high spatial frequency roughness (HSFR) on very smooth surfaces, crucial for semiconductor and EUV optics industries.
AFM provides unparalleled resolution for characterizing graphene's electrical and mechanical properties, essential for advanced nanodevice design.
In this interview, we speak with Stanford's Gu Group about their newly developed metal nanocluster-based material that's advancing nanoscale 3D printing.
By Megan Craig
12 Jan 2023
The right sample preparation for electron microscopy can help minimize damage and help ensure surfaces are clean and free from contamination.
By Rebecca Ingle, Ph.D
12 Jan 2023
Advanced studies of porous nanoparticles are crucial to the development of tomorrow’s highly functional nanomaterials.
Piezo Response Force Microscopy (PFM) enables nanoscale characterization of piezoelectric materials by measuring mechanical deformation under electric fields.
Small angle X-ray scattering, or SAXS, is an experimental method where the intensity of the scattered X-rays is measured as a function of the scattering angle.
By Rebecca Ingle, Ph.D
10 Jan 2023
Kelvin Probe Force Microscopy (KPFM) measures surface potential with improved spatial resolution, crucial for material research. #forceMicroscopy #microscopy
Kelvin probe force microscopy (KPFM) maps surface potential differences, enhancing AFM accuracy by offsetting electrostatic influences.
A novel nanoanalytical technique enables researchers to analyze the composition of a wide range of materials and visualize the elemental distribution in 3D.
By Cvetelin Vasilev
6 Jan 2023