Microscopy News

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PI Extends Line of Nanopositioning Stages for Super-Resolution Microscopy

PI (Physik Instrumente) L.P. -- the inventor of Piezo-Z nanofocusing drives - has extended its line of piezo stages for super-resolution microscopy.

1 May 2009

Invisibility Cloak Hiding Objects from View

The great science fiction writer Arthur C. Clarke famously noted the similarities between advanced technology and magic. This summer on the big screen, the young wizard Harry Potter will once again don his magic invisibility cloak and disappear.

1 May 2009

Live Web Seminar Demonstrating Hardware and Software Solutions for Spectral Microscopy Applications in Nanotechnology

Join ITT Visual Information Solutions, CytoViva, and Bruxton Corporation for a live web seminar demonstrating hardware and software solutions for spectral microscopy applications in nanomedicine, nanomaterials, nanotoxic...

30 Apr 2009

New Approach to Imaging that Does Not Require Traditional CCD or CMOS Video Camera

Ultrafast, light-sensitive video cameras are needed for observing high-speed events such as shockwaves, communication between living cells, neural activity, laser surgery and elements of blood analysis. To catch such elu...

30 Apr 2009

Report Examines Nanotechnology Usage in Medicine

Research and Markets has announced the addition of John Wiley and Sons Ltd's new report "Nanotechnology: Volume 5: Nanomedicine" to their offering. The most authoritative reference covering nanotechnolo...

30 Apr 2009

Microscope User Workshop Attracted over 150 Scientists

More than 150 scientists and users of the ZEISS CrossBeam® and Helium Ion Microscope systems met at the 1st European user workshop in Dresden. In several sessions the participants got an overview on current product developments and new applications.

From Carl Zeiss Microscopy GmbH 30 Apr 2009

FRT Introduces New Optical Profilometer at CONTROL 2009 Exhibition

FRT presents a new profilometer at this year's CONTROL 2009 in Stuttgart. The optical profiler has been optimized for the non-destructive measurement of surfaces. The MicroSpy Profile measures roughness, contour, 3D topography, step height, planarity, geometry, volume, bearing contact area and more with metrological precision.

From Fries Research + Technology GmbH 30 Apr 2009

Leica Microsystems Presents Innovative LED Illumination Modules at SMT 2009

Swift and accurate identification of ultra fine structures, defects, scratches or dust particles in incident light demands a high-performance stereomicroscope, trained eyes and top quality illumination. At the SMT (Systems Integration in Microelectronics) fair in Nuremberg, Leica Microsystems is presenting its innovative LED illumination modules for stereomicroscopes, which offer optimum illumination even for difficult material samples.

From Leica Microsystems GmbH 29 Apr 2009

Kondo Effect Noted in Single-Atom Contacts of Pure Ferromagnets

Spanish and U.S. physicists studying nanoelectronics have found that size really does matter when it comes to predicting the behavior of electrical contacts that are just one atom wide. In new research appearing this...

29 Apr 2009