If an individual is measuring the spatial attributes of a surface, it collapses during the process. This measurement of wear remains a challenge for scientists and manufacturers who try to produce images of the nanomaterial and nanostructure surfaces.
Atomic force microscopes (AFM) have been used by researchers for imaging the nanoscale structures. However, the AFM’s tip is too small and gets damaged when passed through the nano surface being measured. In general, scientists use electron microscope to create images and to measure the wear rate of the tip. But now, many scientists have stopped this measurement process as it is time-consuming and inaccurate.
As an atomic force microscope’s tip degrades, the change in tip size and shape affects its resonant frequency and that can be used to accurately measure, in real time, the change in the tip’s shape, thereby resulting in more accurate measurements and images at nanometer size scales.
A new method, referred as contact resonance force microscopy, to measure the wear rate of AFM tips in real time has been developed by Jason Killgore, a materials engineer at National Institute of Standards and Technology (NIST). The engineer determines the resonant frequency of the tip when the device is in use. The resonant frequency gets affected when there is change in the tip’s size and shape. Thus, he is able to calculate the size of the probe tip as it works. The method can significantly increase the speed and accuracy of nanoscale measurements with AFMs.
AFMs are used globally at R&D facilities, manufacturing plants and universities. Hence, by enhancing their capability to image and measure the nanostructures will help to upgrade the quality and efficiency of the devices. In addition, the new progress will support easy and rapid development of new measurement probes in view of instant feedback on wear rates.
Source: http://www.nist.gov/