Oxford Instruments Nanoanalysis Ship 100th INCAx-act Analytical Drift Detector

Oxford Instruments shipped its 100th INCAx-act Analytical Drift Detector from its factory in the UK on May 11th 2007. INCAx-act is the result of a unique marriage of experience between Oxford Instruments NanoAnalysis, the world’s leading supplier of X-ray analysis systems for the electron microscope, and Ketek GmbH the acknowledged leader in the design and manufacture of silicon drift detector (SDD) sensors.

Analytical Drift Detectors (ADD) combine the speed and operational convenience of liquid nitrogen-free operation of an SDD sensor with the reliability and accuracy of the electronics used in traditional Si(Li) detectors. Therefore, they offer enhanced productivity and convenient operation with none of the compromises seen in conventional SDD detectors. They provide an ideal hardware solution for X-ray analysis in many applications.

‘Customers expect systems from Oxford Instruments to provide the highest quality and reliability of results,’ said Simon Burgess, Marketing Manager at Oxford Instruments NanoAnalysis. ‘They are naturally skeptical of new technology, but their tests have shown they can get the same quality of answers they have come to expect from our Si(Li) detectors. For this reason ADD is fast becoming the detector of choice for microanalysis applications.